Scamming Kelvin Probe for Potential Distribution on Corroding Metal Surface under Thin Electrolyte Layer.

K. Noda, M. Itou, A. Nishikata, T. Tsuru

Research output: Contribution to journal › Article

Original languageEnglish
JournalDefault journal
Publication statusPublished - 1995 Sep 1

Cite this

Scamming Kelvin Probe for Potential Distribution on Corroding Metal Surface under Thin Electrolyte Layer. / Noda, K.; Itou, M.; Nishikata, A.; Tsuru, T.

In: Default journal, 01.09.1995.

Research output: Contribution to journal › Article

Noda, K, Itou, M, Nishikata, A & Tsuru, T 1995, 'Scamming Kelvin Probe for Potential Distribution on Corroding Metal Surface under Thin Electrolyte Layer.', Default journal.
Noda K, Itou M, Nishikata A, Tsuru T. Scamming Kelvin Probe for Potential Distribution on Corroding Metal Surface under Thin Electrolyte Layer. Default journal. 1995 Sep 1.
Noda, K. ; Itou, M. ; Nishikata, A. ; Tsuru, T. / Scamming Kelvin Probe for Potential Distribution on Corroding Metal Surface under Thin Electrolyte Layer. In: Default journal. 1995.
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