| Original language | English |
|---|---|
| Journal | Default journal |
| Publication status | Published - 1995 Sep 1 |
Cite this
Noda, K., Itou, M., Nishikata, A., & Tsuru, T. (1995). Scamming Kelvin Probe for Potential Distribution on Corroding Metal Surface under Thin Electrolyte Layer. Default journal.