Scamming Kelvin Probe for Potential Distribution on Corroding Metal Surface under Thin Electrolyte Layer.

K. Noda, M. Itou, A. Nishikata, T. Tsuru

Research output: Contribution to journalArticle

Original languageEnglish
JournalDefault journal
Publication statusPublished - 1995 Sep 1

Cite this

Scamming Kelvin Probe for Potential Distribution on Corroding Metal Surface under Thin Electrolyte Layer. / Noda, K.; Itou, M.; Nishikata, A.; Tsuru, T.

In: Default journal, 01.09.1995.

Research output: Contribution to journalArticle

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title = "Scamming Kelvin Probe for Potential Distribution on Corroding Metal Surface under Thin Electrolyte Layer.",
author = "K. Noda and M. Itou and A. Nishikata and T. Tsuru",
year = "1995",
month = "9",
day = "1",
language = "English",
journal = "Default journal",

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TY - JOUR

T1 - Scamming Kelvin Probe for Potential Distribution on Corroding Metal Surface under Thin Electrolyte Layer.

AU - Noda, K.

AU - Itou, M.

AU - Nishikata, A.

AU - Tsuru, T.

PY - 1995/9/1

Y1 - 1995/9/1

M3 - Article

JO - Default journal

JF - Default journal

ER -