| Original language | English |
|---|---|
| Journal | Default journal |
| Publication status | Published - 2010 Jun 1 |
Scanning confocal electron microscopy (SCEM)
P. Wang, G. Behan, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, L. Jones, A. I. Kirkl, P. D. Nellist
Research output: Contribution to journal › Article › peer-review