Scanning confocal electron microscopy (SCEM)

P. Wang, G. Behan, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, L. Jones, A. I. Kirkl, P. D. Nellist

Research output: Contribution to journalArticle

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2010 Jun 1

Cite this

Wang, P., Behan, G., Hashimoto, A., Takeguchi, M., Mitsuishi, K., Shimojo, M., ... Nellist, P. D. (2010). Scanning confocal electron microscopy (SCEM). Default journal.

Scanning confocal electron microscopy (SCEM). / Wang, P.; Behan, G.; Hashimoto, A.; Takeguchi, M.; Mitsuishi, K.; Shimojo, M.; Jones, L.; Kirkl, A. I.; Nellist, P. D.

In: Default journal, 01.06.2010.

Research output: Contribution to journalArticle

Wang, P, Behan, G, Hashimoto, A, Takeguchi, M, Mitsuishi, K, Shimojo, M, Jones, L, Kirkl, AI & Nellist, PD 2010, 'Scanning confocal electron microscopy (SCEM)', Default journal.
Wang P, Behan G, Hashimoto A, Takeguchi M, Mitsuishi K, Shimojo M et al. Scanning confocal electron microscopy (SCEM). Default journal. 2010 Jun 1.
Wang, P. ; Behan, G. ; Hashimoto, A. ; Takeguchi, M. ; Mitsuishi, K. ; Shimojo, M. ; Jones, L. ; Kirkl, A. I. ; Nellist, P. D. / Scanning confocal electron microscopy (SCEM). In: Default journal. 2010.
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AU - Behan, G.

AU - Hashimoto, A.

AU - Takeguchi, M.

AU - Mitsuishi, K.

AU - Shimojo, M.

AU - Jones, L.

AU - Kirkl, A. I.

AU - Nellist, P. D.

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