Original language | English |
---|---|
Journal | Default journal |
Publication status | Published - 2012 Dec 1 |
Cite this
Takeguchi, M., Kirkl, M. TX. ZA. HK. MM. S., & Shimojo, M. (2012). Scanning confocal electron microscopy (SCEM) combined with deconvolution technique. Default journal.
Scanning confocal electron microscopy (SCEM) combined with deconvolution technique. / Takeguchi, M.; Kirkl, M. Takeguchi;X.Zhang;A.Hashimoto;K.Mitsuishi;M.Shimoj; Shimojo, Masayuki.
In: Default journal, 01.12.2012.Research output: Contribution to journal › Article
Takeguchi, M, Kirkl, MTXZAHKMMS & Shimojo, M 2012, 'Scanning confocal electron microscopy (SCEM) combined with deconvolution technique', Default journal.
Takeguchi M, Kirkl MTXZAHKMMS, Shimojo M. Scanning confocal electron microscopy (SCEM) combined with deconvolution technique. Default journal. 2012 Dec 1.
@article{ad570679cdd34736994f2a5de94448ee,
title = "Scanning confocal electron microscopy (SCEM) combined with deconvolution technique",
author = "M. Takeguchi and Kirkl, {M. Takeguchi;X.Zhang;A.Hashimoto;K.Mitsuishi;M.Shimoj} and Masayuki Shimojo",
year = "2012",
month = "12",
day = "1",
language = "English",
journal = "Default journal",
}
TY - JOUR
T1 - Scanning confocal electron microscopy (SCEM) combined with deconvolution technique
AU - Takeguchi, M.
AU - Kirkl, M. Takeguchi;X.Zhang;A.Hashimoto;K.Mitsuishi;M.Shimoj
AU - Shimojo, Masayuki
PY - 2012/12/1
Y1 - 2012/12/1
M3 - Article
JO - Default journal
JF - Default journal
ER -