Scanning confocal electron microscopy (SCEM) combined with deconvolution technique

M. Takeguchi, M. Takeguchi;X.Zhang;A.Hashimoto;K.Mitsuishi;M.Shimoj Kirkl, Masayuki Shimojo

Research output: Contribution to journal › Article

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2012 Dec 1

Cite this

Scanning confocal electron microscopy (SCEM) combined with deconvolution technique. / Takeguchi, M.; Kirkl, M. Takeguchi;X.Zhang;A.Hashimoto;K.Mitsuishi;M.Shimoj; Shimojo, Masayuki.

In: Default journal, 01.12.2012.

Research output: Contribution to journal › Article

Takeguchi, M, Kirkl, MTXZAHKMMS & Shimojo, M 2012, 'Scanning confocal electron microscopy (SCEM) combined with deconvolution technique', Default journal.
Takeguchi M, Kirkl MTXZAHKMMS, Shimojo M. Scanning confocal electron microscopy (SCEM) combined with deconvolution technique. Default journal. 2012 Dec 1.
Takeguchi, M. ; Kirkl, M. Takeguchi;X.Zhang;A.Hashimoto;K.Mitsuishi;M.Shimoj ; Shimojo, Masayuki. / Scanning confocal electron microscopy (SCEM) combined with deconvolution technique. In: Default journal. 2012.
@article{ad570679cdd34736994f2a5de94448ee,
title = "Scanning confocal electron microscopy (SCEM) combined with deconvolution technique",
author = "M. Takeguchi and Kirkl, {M. Takeguchi;X.Zhang;A.Hashimoto;K.Mitsuishi;M.Shimoj} and Masayuki Shimojo",
year = "2012",
month = "12",
day = "1",
language = "English",
journal = "Default journal",

}

TY - JOUR

T1 - Scanning confocal electron microscopy (SCEM) combined with deconvolution technique

AU - Takeguchi, M.

AU - Kirkl, M. Takeguchi;X.Zhang;A.Hashimoto;K.Mitsuishi;M.Shimoj

AU - Shimojo, Masayuki

PY - 2012/12/1

Y1 - 2012/12/1

M3 - Article

JO - Default journal

JF - Default journal

ER -