Scanning confocal electron microscopy (SCEM) combined with deconvolution technique

M. Takeguchi, M. Takeguchi;X.Zhang;A.Hashimoto;K.Mitsuishi;M.Shimoj Kirkl, Masayuki Shimojo

Research output: Contribution to journalArticle

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2012 Dec 1

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