Scanning confocal electron microscopy (SCEM) combined with deconvolution technique

M. Takeguchi, M. Takeguchi;X.Zhang;A.Hashimoto;K.Mitsuishi;M.Shimoj Kirkl, Masayuki Shimojo

Functional Control Systems

Research output: Contribution to journal › Article

Original language	English
Journal	Default journal
Publication status	Published - 2012 Dec 1

Cite this

Takeguchi, M., Kirkl, M. TX. ZA. HK. MM. S., & Shimojo, M. (2012). Scanning confocal electron microscopy (SCEM) combined with deconvolution technique. Default journal.