Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

M. Takeguchi, X. Zhang, A. Hashimoto, K. Mitsuishi, Masayuki Shimojo, P. Wang, N. D. Peter, A. I. Kirkland

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)332-333
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
DOIs
Publication statusPublished - 2012

ASJC Scopus subject areas

  • Instrumentation

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