Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

M. Takeguchi, X. Zhang, A. Hashimoto, K. Mitsuishi, Masayuki Shimojo, P. Wang, N. D. Peter, A. I. Kirkland

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)332-333
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
DOIs
Publication statusPublished - 2012

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Confocal microscopy
Deconvolution
Electron microscopy
Scanning
scanning electron microscopy

ASJC Scopus subject areas

  • Instrumentation

Cite this

Takeguchi, M., Zhang, X., Hashimoto, A., Mitsuishi, K., Shimojo, M., Wang, P., ... Kirkland, A. I. (2012). Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique. Microscopy and Microanalysis, 18, 332-333. https://doi.org/10.1017/S1431927612003510

Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique. / Takeguchi, M.; Zhang, X.; Hashimoto, A.; Mitsuishi, K.; Shimojo, Masayuki; Wang, P.; Peter, N. D.; Kirkland, A. I.

In: Microscopy and Microanalysis, Vol. 18, 2012, p. 332-333.

Research output: Contribution to journalArticle

Takeguchi, M, Zhang, X, Hashimoto, A, Mitsuishi, K, Shimojo, M, Wang, P, Peter, ND & Kirkland, AI 2012, 'Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique', Microscopy and Microanalysis, vol. 18, pp. 332-333. https://doi.org/10.1017/S1431927612003510
Takeguchi, M. ; Zhang, X. ; Hashimoto, A. ; Mitsuishi, K. ; Shimojo, Masayuki ; Wang, P. ; Peter, N. D. ; Kirkland, A. I. / Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique. In: Microscopy and Microanalysis. 2012 ; Vol. 18. pp. 332-333.
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