Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

M. Takeguchi, X. Zhang, A. Hashimoto, K. Mitsuishi, M. Shimojo, P. Wang, N. D. Peter, A. I. Kirkland

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

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