Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

P. Wang, G. Behan, A. I. Kirkl, P. D. Nellist, E. C. Cosgriff, A. J. D'Alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo

Research output: Contribution to journal › Article

14 Citations (Scopus)
Original languageEnglish
JournalDefault journal
Publication statusPublished - 2011 Sep 1

Cite this

Wang, P., Behan, G., Kirkl, A. I., Nellist, P. D., Cosgriff, E. C., D'Alfonso, A. J., ... Shimojo, M. (2011). Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. Default journal.

Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. / Wang, P.; Behan, G.; Kirkl, A. I.; Nellist, P. D.; Cosgriff, E. C.; D'Alfonso, A. J.; Morgan, A. J.; Allen, L. J.; Hashimoto, A.; Takeguchi, M.; Mitsuishi, K.; Shimojo, M.

In: Default journal, 01.09.2011.

Research output: Contribution to journal › Article

Wang, P, Behan, G, Kirkl, AI, Nellist, PD, Cosgriff, EC, D'Alfonso, AJ, Morgan, AJ, Allen, LJ, Hashimoto, A, Takeguchi, M, Mitsuishi, K & Shimojo, M 2011, 'Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope', Default journal.
Wang P, Behan G, Kirkl AI, Nellist PD, Cosgriff EC, D'Alfonso AJ et al. Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. Default journal. 2011 Sep 1.
Wang, P. ; Behan, G. ; Kirkl, A. I. ; Nellist, P. D. ; Cosgriff, E. C. ; D'Alfonso, A. J. ; Morgan, A. J. ; Allen, L. J. ; Hashimoto, A. ; Takeguchi, M. ; Mitsuishi, K. ; Shimojo, M. / Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. In: Default journal. 2011.
@article{ba78fc61231d404dbf157010cdfeac38,
title = "Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope",
author = "P. Wang and G. Behan and Kirkl, {A. I.} and Nellist, {P. D.} and Cosgriff, {E. C.} and D'Alfonso, {A. J.} and Morgan, {A. J.} and Allen, {L. J.} and A. Hashimoto and M. Takeguchi and K. Mitsuishi and M. Shimojo",
year = "2011",
month = "9",
day = "1",
language = "English",
journal = "Default journal",

}

TY - JOUR

T1 - Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

AU - Wang, P.

AU - Behan, G.

AU - Kirkl, A. I.

AU - Nellist, P. D.

AU - Cosgriff, E. C.

AU - D'Alfonso, A. J.

AU - Morgan, A. J.

AU - Allen, L. J.

AU - Hashimoto, A.

AU - Takeguchi, M.

AU - Mitsuishi, K.

AU - Shimojo, M.

PY - 2011/9/1

Y1 - 2011/9/1

M3 - Article

JO - Default journal

JF - Default journal

ER -