Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

P. Wang; G. Behan; A. I. Kirkl; P. D. Nellist; E. C. Cosgriff; A. J. D'Alfonso; A. J. Morgan; L. J. Allen; A. Hashimoto; M. Takeguchi; K. Mitsuishi; M. Shimojo

Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

P. Wang, G. Behan, A. I. Kirkl, P. D. Nellist, E. C. Cosgriff, A. J. D'Alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo

Functional Control Systems

Research output: Contribution to journal › Article › peer-review

16 Citations (Scopus)

Original language	English
Journal	Default journal
Publication status	Published - 2011 Sep 1

Cite this

Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. / Wang, P.; Behan, G.; Kirkl, A. I.; Nellist, P. D.; Cosgriff, E. C.; D'Alfonso, A. J.; Morgan, A. J.; Allen, L. J.; Hashimoto, A.; Takeguchi, M.; Mitsuishi, K.; Shimojo, M.

In: Default journal, 01.09.2011.

Research output: Contribution to journal › Article › peer-review

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AU - Kirkl, A. I.

AU - Nellist, P. D.

AU - Cosgriff, E. C.

AU - D'Alfonso, A. J.

AU - Morgan, A. J.

AU - Allen, L. J.

AU - Hashimoto, A.

AU - Takeguchi, M.

AU - Mitsuishi, K.

AU - Shimojo, M.

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