Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

P. Wang, G. Behan, A. I. Kirkl, P. D. Nellist, E. C. Cosgriff, A. J. D'Alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo

Research output: Contribution to journalArticle

14 Citations (Scopus)
Original languageEnglish
JournalDefault journal
Publication statusPublished - 2011 Sep 1

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Wang, P., Behan, G., Kirkl, A. I., Nellist, P. D., Cosgriff, E. C., D'Alfonso, A. J., ... Shimojo, M. (2011). Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. Default journal.