Original language | English |
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Journal | Default journal |
Publication status | Published - 2011 Sep 1 |
Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope
P. Wang, G. Behan, A. I. Kirkl, P. D. Nellist, E. C. Cosgriff, A. J. D'Alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo
Research output: Contribution to journal › Article › peer-review
19
Citations
(Scopus)