Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

P. Wang, G. Behan, A. I. Kirkl, P. D. Nellist, E. C. Cosgriff, A. J. D'Alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)
Original languageEnglish
JournalDefault journal
Publication statusPublished - 2011 Sep 1

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