Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

P. Wang; G. Behan; A. I. Kirkl; P. D. Nellist; E. C. Cosgriff; A. J. D'Alfonso; A. J. Morgan; L. J. Allen; A. Hashimoto; M. Takeguchi; K. Mitsuishi; M. Shimojo

Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

P. Wang, G. Behan, A. I. Kirkl, P. D. Nellist, E. C. Cosgriff, A. J. D'Alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo

Functional Control Systems

Research output: Contribution to journal › Article

14 Citations (Scopus)

Original language	English
Journal	Default journal
Publication status	Published - 2011 Sep 1

Cite this

Wang, P., Behan, G., Kirkl, A. I., Nellist, P. D., Cosgriff, E. C., D'Alfonso, A. J., Morgan, A. J., Allen, L. J., Hashimoto, A., Takeguchi, M., Mitsuishi, K., & Shimojo, M. (2011). Scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. Default journal.

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author = "P. Wang and G. Behan and Kirkl, {A. I.} and Nellist, {P. D.} and Cosgriff, {E. C.} and D'Alfonso, {A. J.} and Morgan, {A. J.} and Allen, {L. J.} and A. Hashimoto and M. Takeguchi and K. Mitsuishi and M. Shimojo",

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AU - Wang, P.

AU - Behan, G.

AU - Kirkl, A. I.

AU - Nellist, P. D.

AU - Cosgriff, E. C.

AU - D'Alfonso, A. J.

AU - Morgan, A. J.

AU - Allen, L. J.

AU - Hashimoto, A.

AU - Takeguchi, M.

AU - Mitsuishi, K.

AU - Shimojo, M.

PY - 2011/9/1

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M3 - Article

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JF - Default journal

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