Similarities of buffer-related lag phenomena and current slump between GaN MESFETs and AlGaN/GaN HEMTs

K. Horio, H. Takayanagi, K. Itagaki, A. Nakajima

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)140-145
JournalProceedings of the 3rd Asia-Pacific Workshop on Widegap Semiconductors (APWS 2007), Jeonju, Korea
Publication statusPublished - 2007 Mar 13

Cite this