Simulation of lag phenomena and pulsed I-V curves of compound semiconductor FETs as affected by impact ionization

Y. Kazami, D. Kasai, Y. Mitani, K. Horio

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)203-206
JournalJournal of Computational Electronics
VolumeVol.2
Publication statusPublished - 2003 Dec 1

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