Simulation of reduction properties of radiated emission by on-chip decoupling capacitor

Toshio Sudo, Manabu Bonkohara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper reports simulation results on simultaneous switching noise and radiated emission due to the existence of on-chip decoupling capacitor. Signal overshoots/undershoots was observed for the case of on-chip decoupling capacitor, while signal degradation was observed for the case of without on-chip decoupling capacitor. The behavior of ground bounce for the case of on-chip capacitor was different from the case of without on-chip capacitor. The current flow at the power and ground terminals was used as excitation source of FDTD model with the power/ ground plane. The simulation results were compared with the measurement data.

Original languageEnglish
Title of host publicationProceedings - 6th IEEE Workshop on Signal Propagation on Interconnects, SPI
Pages15-18
Number of pages4
DOIs
Publication statusPublished - 2002 Dec 1
Event6th IEEE Workshop on Signal Propagation on Interconnects, SPI - Pisa, Italy
Duration: 2002 May 122002 May 15

Publication series

NameProceedings - 6th IEEE Workshop on Signal Propagation on Interconnects, SPI

Conference

Conference6th IEEE Workshop on Signal Propagation on Interconnects, SPI
CountryItaly
CityPisa
Period02/5/1202/5/15

ASJC Scopus subject areas

  • Signal Processing
  • Computer Networks and Communications

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  • Cite this

    Sudo, T., & Bonkohara, M. (2002). Simulation of reduction properties of radiated emission by on-chip decoupling capacitor. In Proceedings - 6th IEEE Workshop on Signal Propagation on Interconnects, SPI (pp. 15-18). [4027643] (Proceedings - 6th IEEE Workshop on Signal Propagation on Interconnects, SPI). https://doi.org/10.1109/SPI.2002.258278