Simulation of slow current transients and current collapse in GaN FETs

H. Takayanagi, H. Nakano, K. Yonemoto, K. Horio

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)223-227
JournalJ. Comp. Electron
VolumeVol.5
Publication statusPublished - 2006 Jun 1

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Takayanagi, H., Nakano, H., Yonemoto, K., & Horio, K. (2006). Simulation of slow current transients and current collapse in GaN FETs. J. Comp. Electron, Vol.5, 223-227.