| Original language | English |
|---|---|
| Pages (from-to) | 223-227 |
| Journal | J. Comp. Electron |
| Volume | Vol.5 |
| Publication status | Published - 2006 Jun 1 |
Cite this
Takayanagi, H., Nakano, H., Yonemoto, K., & Horio, K. (2006). Simulation of slow current transients and current collapse in GaN FETs. J. Comp. Electron, Vol.5, 223-227.