| Original language | English |
|---|---|
| Pages (from-to) | 223-227 |
| Journal | J. Comp. Electron |
| Volume | Vol.5 |
| Publication status | Published - 2006 Jun 1 |
Simulation of slow current transients and current collapse in GaN FETs
H. Takayanagi, H. Nakano, K. Yonemoto, K. Horio
Research output: Contribution to journal › Article › peer-review