Simulations of Trapping Effects in GaAs MESFETs and Requirements for Substrates in GaAs MESFET-ICs

K. Horio, Y. Fuseya

Research output: Contribution to journalArticle

60 Citations (Scopus)
Original languageEnglish
Pages (from-to)241-244
JournalProceedings of 1992 IEEE GaAs IC Symposium, Florida, USA
Publication statusPublished - 1992 Oct 1

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