Simultaneous photographing of rapidly bifurcating cracks on both surfaces of plate specimens with pulsed holographic microscopy

Shinichi Suzuki, Kenichi Sakaue

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

When brittle materials break under external force, fast propagating cracks appear often whose propagation speed is from 200m/s to 2000m/s. The fast propagating cracks suddenly bifurcate into two cracks when the propagation speed is high enough. But the mechanism of the rapid crack bifurcation has not been well understood. In the present study, two optical systems of pulsed holographic microscopy are applied to take photographs of rapidly bifurcating cracks in PMMA plate specimens. The cracks are of the opening mode and propagate at a speed more than 600m/s. The photographs of the cracks are simultaneously taken on the both sides of the plate specimens about 10μs after bifurcation. The photographs show that, in many cases, the shape of branch cracks on one side of a specimen is apparently different from that on the other side of the specimen. The fact indicates that the rapid crack bifurcation in PMMA is of three-dimensional phenomenon. Also shown is that two branched cracks have different crack opening displacements. It means that the bifurcation of the cracks are asymmetric just after bifurcation.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsC. Cavailler, G.P. Haddleton, M. Hugenschmidt
Pages170-175
Number of pages6
Volume4948
DOIs
Publication statusPublished - 2002
Externally publishedYes
EventPROCEEDINGS SPIE - The International Society for Optical Engineering: 25th International Congress on High-Speed Photography and Photonics - Beaune, France
Duration: 2002 Sep 292002 Oct 4

Other

OtherPROCEEDINGS SPIE - The International Society for Optical Engineering: 25th International Congress on High-Speed Photography and Photonics
CountryFrance
CityBeaune
Period02/9/2902/10/4

Fingerprint

Microscopic examination
cracks
microscopy
Cracks
photographs
brittle materials
crack opening displacement
propagation
Brittleness
Optical systems
Crack propagation
high speed

Keywords

  • Crack bifurcation
  • Dynamic fracture
  • High-speed photography
  • Holography
  • Microscopy

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Suzuki, S., & Sakaue, K. (2002). Simultaneous photographing of rapidly bifurcating cracks on both surfaces of plate specimens with pulsed holographic microscopy. In C. Cavailler, G. P. Haddleton, & M. Hugenschmidt (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4948, pp. 170-175) https://doi.org/10.1117/12.516819

Simultaneous photographing of rapidly bifurcating cracks on both surfaces of plate specimens with pulsed holographic microscopy. / Suzuki, Shinichi; Sakaue, Kenichi.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / C. Cavailler; G.P. Haddleton; M. Hugenschmidt. Vol. 4948 2002. p. 170-175.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Suzuki, S & Sakaue, K 2002, Simultaneous photographing of rapidly bifurcating cracks on both surfaces of plate specimens with pulsed holographic microscopy. in C Cavailler, GP Haddleton & M Hugenschmidt (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 4948, pp. 170-175, PROCEEDINGS SPIE - The International Society for Optical Engineering: 25th International Congress on High-Speed Photography and Photonics, Beaune, France, 02/9/29. https://doi.org/10.1117/12.516819
Suzuki S, Sakaue K. Simultaneous photographing of rapidly bifurcating cracks on both surfaces of plate specimens with pulsed holographic microscopy. In Cavailler C, Haddleton GP, Hugenschmidt M, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 4948. 2002. p. 170-175 https://doi.org/10.1117/12.516819
Suzuki, Shinichi ; Sakaue, Kenichi. / Simultaneous photographing of rapidly bifurcating cracks on both surfaces of plate specimens with pulsed holographic microscopy. Proceedings of SPIE - The International Society for Optical Engineering. editor / C. Cavailler ; G.P. Haddleton ; M. Hugenschmidt. Vol. 4948 2002. pp. 170-175
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