Single-shot measurement of the carrier-envelope phase through observation of the self-referencing spectral interferometry

M. Kakehata, H. Takada, Y. Kobayashi, K. Torizuka, Y. Fujihira, Tetsuya Homma, H. Takahashi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The carrier-envelope phase (CEP) of amplified laser pulses generated by a chirped-pulse-amplification (CPA) system was measured. Single-shot measurement of the CEP was conducted using spectral interferometry (SI) between the white light continuum and its second harmonic. Group delay of the spectrum was assumed to be stable. The SI signals were analyzed using Fourier transforms and a filtering technique. The data was used to calculate the relative phase and relative group delay between the fundamental and the SH components. The difference of the relative phase between two pulses was found to be wavelength independent.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics Europe - Technical Digest
Publication statusPublished - 2001
Externally publishedYes
EventConference on Lasers and Electro-Optics (CLEO) - Baltimore, MD
Duration: 2001 May 62001 May 11

Other

OtherConference on Lasers and Electro-Optics (CLEO)
CityBaltimore, MD
Period01/5/601/5/11

Fingerprint

Group delay
Interferometry
Laser pulses
Amplification
Fourier transforms
Wavelength

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Cite this

Kakehata, M., Takada, H., Kobayashi, Y., Torizuka, K., Fujihira, Y., Homma, T., & Takahashi, H. (2001). Single-shot measurement of the carrier-envelope phase through observation of the self-referencing spectral interferometry. In Conference on Lasers and Electro-Optics Europe - Technical Digest

Single-shot measurement of the carrier-envelope phase through observation of the self-referencing spectral interferometry. / Kakehata, M.; Takada, H.; Kobayashi, Y.; Torizuka, K.; Fujihira, Y.; Homma, Tetsuya; Takahashi, H.

Conference on Lasers and Electro-Optics Europe - Technical Digest. 2001.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kakehata, M, Takada, H, Kobayashi, Y, Torizuka, K, Fujihira, Y, Homma, T & Takahashi, H 2001, Single-shot measurement of the carrier-envelope phase through observation of the self-referencing spectral interferometry. in Conference on Lasers and Electro-Optics Europe - Technical Digest. Conference on Lasers and Electro-Optics (CLEO), Baltimore, MD, 01/5/6.
Kakehata M, Takada H, Kobayashi Y, Torizuka K, Fujihira Y, Homma T et al. Single-shot measurement of the carrier-envelope phase through observation of the self-referencing spectral interferometry. In Conference on Lasers and Electro-Optics Europe - Technical Digest. 2001
Kakehata, M. ; Takada, H. ; Kobayashi, Y. ; Torizuka, K. ; Fujihira, Y. ; Homma, Tetsuya ; Takahashi, H. / Single-shot measurement of the carrier-envelope phase through observation of the self-referencing spectral interferometry. Conference on Lasers and Electro-Optics Europe - Technical Digest. 2001.
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