Small Signal Characteristics of n+Ge Gate AlGaAs/GaAs MISFETs

Shiuichi Fujita, Makoto Hirano, Koichi Maezawa, Takashi Mizutani

    Research output: Contribution to journalArticle

    2 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)518-520
    JournalIEEE Electron Device Letters
    VolumeEDL-9
    Publication statusPublished - 1988 Apr 1

    Cite this

    Fujita, S., Hirano, M., Maezawa, K., & Mizutani, T. (1988). Small Signal Characteristics of n+Ge Gate AlGaAs/GaAs MISFETs. IEEE Electron Device Letters, EDL-9, 518-520.