Spectroscopic ellipsometry analysis of multilayered TiO2-Ag thin films for photochromic application

L. Miao, T. Jiang, S. Tanemura, M. Tanemura, N. Nabatova-Gabain, G. Xu

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)

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Physics & Astronomy