Spectroscopic ellipsometry measurements for liquid and solid InSb around its melting point

Masashi Kuwahara, Rie Endo, Kouichi Tsutsumi, Fukuyoshi Morikasa, Michio Suzuki, Takayuki Shima, Masahiro Susa, Tomoyoshi Endo, Toshiyasu Tadokoro, Sumio Hosaka

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

We have carried out spectroscopic ellipsometry measurements for liquid- and solid-phase InSb around its melting point for wavelengths of 300 to 1700 nm. The real and imaginary parts of the complex refractive index for liquid and solid InSb appear to be completely different, with the imaginary part for the liquid being higher than that of the solid. This result agrees with the proposed mechanism for the super-resolution readout effect in optical disks using an InSb film. From a dielectric function analysis, we find that InSb characteristics clearly change from semiconducting in the solid to metallic in the liquid.

Original languageEnglish
Article number082501
JournalApplied Physics Express
Volume6
Issue number8
DOIs
Publication statusPublished - 2013 Aug
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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