Stripe and criss-cross patterns in high-Tc superconductors revealed by atomic force microscopy and scanning tunnelling microscopy

Michael Rudolf Koblischka, Marc Winter, Anming Hu, Masato Murakami, Uwe Hartmann

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13 Citations (Scopus)


By using atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) at ambient conditions, we have investigated the topographies of various surfaces of bulk samples of YBa2Cu3Ox (YBCO), SmBa2Cu3Ox- (SmBCO), and (Sm,Eu,Gd)Ba 2Cu3Ox (SEG) oxidic high-Tc superconductors. We find that the last two systems exhibit microstructures on the nanometer scale which are remarkably different from those obtained in the YBCO system. The stripe-like growth structures observed in our topography measurements may be the key for the considerable improvements concerning the critical current densities especially at high magnetic fields and elevated operating temperature (77 K). The properties of the microstructures are discussed in detail.

Original languageEnglish
Pages (from-to)2259-2263
Number of pages5
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Issue number3 B
Publication statusPublished - 2006 Mar 27



  • AFM
  • Aging
  • Composition modulation
  • High-T superconductors
  • Nanostripes
  • Oxides
  • STM

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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