Stripe and criss-cross patterns in high-Tc superconductors revealed by atomic force microscopy and scanning tunnelling microscopy

Michael R. Koblischka; Marc Winter; Anming Hu; Masato Murakami; Uwe Hartmann

doi:10.1143/JJAP.45.2259

Stripe and criss-cross patterns in high-T_c superconductors revealed by atomic force microscopy and scanning tunnelling microscopy

Michael R. Koblischka, Marc Winter, Anming Hu, Masato Murakami, Uwe Hartmann

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

By using atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) at ambient conditions, we have investigated the topographies of various surfaces of bulk samples of YBa₂Cu₃O_x (YBCO), SmBa₂Cu₃O_x- (SmBCO), and (Sm,Eu,Gd)Ba ₂Cu₃O_x (SEG) oxidic high-T_c superconductors. We find that the last two systems exhibit microstructures on the nanometer scale which are remarkably different from those obtained in the YBCO system. The stripe-like growth structures observed in our topography measurements may be the key for the considerable improvements concerning the critical current densities especially at high magnetic fields and elevated operating temperature (77 K). The properties of the microstructures are discussed in detail.

Original language	English
Pages (from-to)	2259-2263
Number of pages	5
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	45
Issue number	3 B
DOIs	https://doi.org/10.1143/JJAP.45.2259
Publication status	Published - 2006 Mar 27
Externally published	Yes

Keywords

AFM
Aging
Composition modulation
High-T superconductors
Nanostripes
Oxides
STM

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

Access to Document

10.1143/JJAP.45.2259

Cite this

Stripe and criss-cross patterns in high-T_c superconductors revealed by atomic force microscopy and scanning tunnelling microscopy. / Koblischka, Michael R.; Winter, Marc; Hu, Anming et al.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 45, No. 3 B, 27.03.2006, p. 2259-2263.

Research output: Contribution to journal › Article › peer-review

@article{47cda8efcdf74633bee946eb6d7fbd52,

title = "Stripe and criss-cross patterns in high-Tc superconductors revealed by atomic force microscopy and scanning tunnelling microscopy",

abstract = "By using atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) at ambient conditions, we have investigated the topographies of various surfaces of bulk samples of YBa2Cu3Ox (YBCO), SmBa2Cu3Ox- (SmBCO), and (Sm,Eu,Gd)Ba 2Cu3Ox (SEG) oxidic high-Tc superconductors. We find that the last two systems exhibit microstructures on the nanometer scale which are remarkably different from those obtained in the YBCO system. The stripe-like growth structures observed in our topography measurements may be the key for the considerable improvements concerning the critical current densities especially at high magnetic fields and elevated operating temperature (77 K). The properties of the microstructures are discussed in detail.",

keywords = "AFM, Aging, Composition modulation, High-T superconductors, Nanostripes, Oxides, STM",

author = "Koblischka, {Michael R.} and Marc Winter and Anming Hu and Masato Murakami and Uwe Hartmann",

year = "2006",

month = mar,

day = "27",

doi = "10.1143/JJAP.45.2259",

language = "English",

volume = "45",

pages = "2259--2263",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "3 B",

}

TY - JOUR

T1 - Stripe and criss-cross patterns in high-Tc superconductors revealed by atomic force microscopy and scanning tunnelling microscopy

AU - Koblischka, Michael R.

AU - Winter, Marc

AU - Hu, Anming

AU - Murakami, Masato

AU - Hartmann, Uwe

PY - 2006/3/27

Y1 - 2006/3/27

N2 - By using atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) at ambient conditions, we have investigated the topographies of various surfaces of bulk samples of YBa2Cu3Ox (YBCO), SmBa2Cu3Ox- (SmBCO), and (Sm,Eu,Gd)Ba 2Cu3Ox (SEG) oxidic high-Tc superconductors. We find that the last two systems exhibit microstructures on the nanometer scale which are remarkably different from those obtained in the YBCO system. The stripe-like growth structures observed in our topography measurements may be the key for the considerable improvements concerning the critical current densities especially at high magnetic fields and elevated operating temperature (77 K). The properties of the microstructures are discussed in detail.

AB - By using atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) at ambient conditions, we have investigated the topographies of various surfaces of bulk samples of YBa2Cu3Ox (YBCO), SmBa2Cu3Ox- (SmBCO), and (Sm,Eu,Gd)Ba 2Cu3Ox (SEG) oxidic high-Tc superconductors. We find that the last two systems exhibit microstructures on the nanometer scale which are remarkably different from those obtained in the YBCO system. The stripe-like growth structures observed in our topography measurements may be the key for the considerable improvements concerning the critical current densities especially at high magnetic fields and elevated operating temperature (77 K). The properties of the microstructures are discussed in detail.

KW - AFM

KW - Aging

KW - Composition modulation

KW - High-T superconductors

KW - Nanostripes

KW - Oxides

KW - STM

UR - http://www.scopus.com/inward/record.url?scp=33645516626&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33645516626&partnerID=8YFLogxK

U2 - 10.1143/JJAP.45.2259

DO - 10.1143/JJAP.45.2259

M3 - Article

AN - SCOPUS:33645516626

SN - 0021-4922

VL - 45

SP - 2259

EP - 2263

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

IS - 3 B

ER -