Structural characterization of shock-affected sapphire

M. Mazilu, S. Juodkazis, T. Ebisui, S. Matsuo, H. Misawa

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Abstract

The presence of dislocations has been revealed by numerical processing of high-resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 μm depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of e∼ 8×1012 cm-2.

Original languageEnglish
Pages (from-to)197-200
Number of pages4
JournalApplied Physics A: Materials Science and Processing
Volume86
Issue number2
DOIs
Publication statusPublished - 2007 Feb 1

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ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)

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