Structural characterization of shock-affected sapphire

M. Mazilu, S. Juodkazis, T. Ebisui, Shigeki Matsuo, H. Misawa

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

The presence of dislocations has been revealed by numerical processing of high-resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 μm depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of e∼ 8×1012 cm-2.

Original languageEnglish
Pages (from-to)197-200
Number of pages4
JournalApplied Physics A: Materials Science and Processing
Volume86
Issue number2
DOIs
Publication statusPublished - 2007 Feb
Externally publishedYes

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Aluminum Oxide
Sapphire
Shock waves
sapphire
shock
shock wave propagation
High resolution transmission electron microscopy
Wave propagation
shock waves
pulse duration
Crystalline materials
Wavelength
transmission electron microscopy
high resolution
Processing
wavelengths

ASJC Scopus subject areas

  • Materials Science(all)
  • Physics and Astronomy (miscellaneous)

Cite this

Structural characterization of shock-affected sapphire. / Mazilu, M.; Juodkazis, S.; Ebisui, T.; Matsuo, Shigeki; Misawa, H.

In: Applied Physics A: Materials Science and Processing, Vol. 86, No. 2, 02.2007, p. 197-200.

Research output: Contribution to journalArticle

Mazilu, M. ; Juodkazis, S. ; Ebisui, T. ; Matsuo, Shigeki ; Misawa, H. / Structural characterization of shock-affected sapphire. In: Applied Physics A: Materials Science and Processing. 2007 ; Vol. 86, No. 2. pp. 197-200.
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