Structural health monitoring based on laser excitation vibration test and wavelet transform

Shanshan Cao, Itsuro Kajiwara, Xisheng Li, Naoki Hosoya

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In this paper, a vibration testing and health monitoring system is proposed to detect damage in aluminum plate structures. This system is based on an impulse response excited by laser. A high power Nd:YAG pulse laser is used to produce an ideal impulse excitation via laser-ablation on an aluminum plate surface. The propagation, reflection and superposition of elastic wave will be happened in structures. Laser Doppler vibrometer is used for measuring data. And by means of spectrum analyzer and computer, wavelet transform is applied to analyze the waveform characteristics to detect and identify the location of the damage. The applicability of the present approach is validated by simulation and experimental results, demonstrating the ability of the method to detect and identify the location of damage induced on the aluminum plate structures.

Original languageEnglish
Title of host publication2017 11th International Conference on Sensing Technology, ICST 2017
PublisherIEEE Computer Society
Pages1-6
Number of pages6
ISBN (Electronic)9781509065264
DOIs
Publication statusPublished - 2018 Feb 27
Event11th International Conference on Sensing Technology, ICST 2017 - Sydney, Australia
Duration: 2017 Dec 42017 Dec 6

Publication series

NameProceedings of the International Conference on Sensing Technology, ICST
Volume2017-December
ISSN (Print)2156-8065
ISSN (Electronic)2156-8073

Other

Other11th International Conference on Sensing Technology, ICST 2017
Country/TerritoryAustralia
CitySydney
Period17/12/417/12/6

Keywords

  • Damage Detection
  • Impulse Response
  • Laser Ablation
  • Laser Excitation
  • Vibration Test
  • Wavelet Transform

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Science Applications
  • Signal Processing
  • Electrical and Electronic Engineering

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