Study of cross-sections of magnetite thin films by means of electron backscatter diffraction (EBSD)

A. Koblischka-Veneva, M. R. Koblischka, F. Mücklich, U. Hartmann

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1 Citation (Scopus)


By means of electron backscatter diffraction (EBSD), we studied the grain orientation of cross-sections of magnetite (Fe 3O 4) thin films grown on (001) oriented MgO substrates. Earlier studies showed that the magnetic properties of the magnetite films are dominated by the presence of so-called anti-phase boundaries (APBs). The use of cross-sections of thin-films enables to study the growth mechanism in a more direct way. The EBSD maps reveal that the first magnetite layer on the MgO substrate is comprised of many small, misoriented magnetite grains. Subsequent layers show the desired (001) orientation with a ±5° misorientation. The misorientations found in the cross-section of the film resemble those obtained in EBSD measurements at the sample surface.

Original languageEnglish
Pages (from-to)1835-1838
Number of pages4
JournalPhysica Status Solidi (A) Applications and Materials Science
Issue number8
Publication statusPublished - 2008 Aug 1


ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering
  • Materials Chemistry

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