Study on reduction in radiated emissions from PCB using test LSI

Satoru Haga, Ken Nakano, Toshio Sudo, Osamu Hashimoto

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Radiation mechanism and reduction measures have been studied using test large scale integrated (LSI) circuits. The LSI operation mode that simultaneously drives external traces radiates the greatest amount of emissions. In this mode, an LSI-mounted areas has been found to behave as an opening from the electromagnetic viewpoint. Two approaches under consideration, ferrite on the LSI package and a copper sheet covering the LSI package, were verified to reduce emissions very effectively.

Original languageEnglish
Pages (from-to)238-242
Number of pages5
JournalMicrowave and Optical Technology Letters
Volume36
Issue number4
DOIs
Publication statusPublished - 2003 Feb 20

Fingerprint

polychlorinated biphenyls
Polychlorinated Biphenyls
Polychlorinated biphenyls
Ferrite
Integrated circuits
Copper
Radiation
integrated circuits
ferrites
coverings
electromagnetism
copper
radiation

Keywords

  • Near electric field distribution
  • Near magnetic field distribution
  • Output buffer operation
  • Radiated emission
  • Test LSI

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Cite this

Study on reduction in radiated emissions from PCB using test LSI. / Haga, Satoru; Nakano, Ken; Sudo, Toshio; Hashimoto, Osamu.

In: Microwave and Optical Technology Letters, Vol. 36, No. 4, 20.02.2003, p. 238-242.

Research output: Contribution to journalArticle

Haga, Satoru ; Nakano, Ken ; Sudo, Toshio ; Hashimoto, Osamu. / Study on reduction in radiated emissions from PCB using test LSI. In: Microwave and Optical Technology Letters. 2003 ; Vol. 36, No. 4. pp. 238-242.
@article{d0c572044f564173b485cacbde6e17da,
title = "Study on reduction in radiated emissions from PCB using test LSI",
abstract = "Radiation mechanism and reduction measures have been studied using test large scale integrated (LSI) circuits. The LSI operation mode that simultaneously drives external traces radiates the greatest amount of emissions. In this mode, an LSI-mounted areas has been found to behave as an opening from the electromagnetic viewpoint. Two approaches under consideration, ferrite on the LSI package and a copper sheet covering the LSI package, were verified to reduce emissions very effectively.",
keywords = "Near electric field distribution, Near magnetic field distribution, Output buffer operation, Radiated emission, Test LSI",
author = "Satoru Haga and Ken Nakano and Toshio Sudo and Osamu Hashimoto",
year = "2003",
month = "2",
day = "20",
doi = "10.1002/mop.10732",
language = "English",
volume = "36",
pages = "238--242",
journal = "Microwave and Optical Technology Letters",
issn = "0895-2477",
publisher = "John Wiley and Sons Inc.",
number = "4",

}

TY - JOUR

T1 - Study on reduction in radiated emissions from PCB using test LSI

AU - Haga, Satoru

AU - Nakano, Ken

AU - Sudo, Toshio

AU - Hashimoto, Osamu

PY - 2003/2/20

Y1 - 2003/2/20

N2 - Radiation mechanism and reduction measures have been studied using test large scale integrated (LSI) circuits. The LSI operation mode that simultaneously drives external traces radiates the greatest amount of emissions. In this mode, an LSI-mounted areas has been found to behave as an opening from the electromagnetic viewpoint. Two approaches under consideration, ferrite on the LSI package and a copper sheet covering the LSI package, were verified to reduce emissions very effectively.

AB - Radiation mechanism and reduction measures have been studied using test large scale integrated (LSI) circuits. The LSI operation mode that simultaneously drives external traces radiates the greatest amount of emissions. In this mode, an LSI-mounted areas has been found to behave as an opening from the electromagnetic viewpoint. Two approaches under consideration, ferrite on the LSI package and a copper sheet covering the LSI package, were verified to reduce emissions very effectively.

KW - Near electric field distribution

KW - Near magnetic field distribution

KW - Output buffer operation

KW - Radiated emission

KW - Test LSI

UR - http://www.scopus.com/inward/record.url?scp=0037456220&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037456220&partnerID=8YFLogxK

U2 - 10.1002/mop.10732

DO - 10.1002/mop.10732

M3 - Article

AN - SCOPUS:0037456220

VL - 36

SP - 238

EP - 242

JO - Microwave and Optical Technology Letters

JF - Microwave and Optical Technology Letters

SN - 0895-2477

IS - 4

ER -