Study on reduction in radiated emissions from PCB using test LSI

Satoru Haga, Ken Nakano, Toshio Sudo, Osamu Hashimoto

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Radiation mechanism and reduction measures have been studied using test large scale integrated (LSI) circuits. The LSI operation mode that simultaneously drives external traces radiates the greatest amount of emissions. In this mode, an LSI-mounted areas has been found to behave as an opening from the electromagnetic viewpoint. Two approaches under consideration, ferrite on the LSI package and a copper sheet covering the LSI package, were verified to reduce emissions very effectively.

Original languageEnglish
Pages (from-to)238-242
Number of pages5
JournalMicrowave and Optical Technology Letters
Volume36
Issue number4
DOIs
Publication statusPublished - 2003 Feb 20

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Keywords

  • Near electric field distribution
  • Near magnetic field distribution
  • Output buffer operation
  • Radiated emission
  • Test LSI

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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