Surface defects and bulk defect migration produced by ion bombardment of Si(001)

K.Kyuno K.Kyuno, D.G.Cahill D.G.Cahill, R.S.Averback R.S.Averback, J.Tarus J.Tarus, K.Nordlund K.Nordlund, Kentaro Kyuno

Research output: Contribution to journalArticle

Original languageEnglish
JournalPhysical Review Letters
Volume83
Publication statusPublished - 1999 Apr 1

Cite this

K.Kyuno, K. K., D.G.Cahill, D. G. C., R.S.Averback, R. S. A., J.Tarus, J. T., K.Nordlund, K. N., & Kyuno, K. (1999). Surface defects and bulk defect migration produced by ion bombardment of Si(001). Physical Review Letters, 83.

Surface defects and bulk defect migration produced by ion bombardment of Si(001). / K.Kyuno, K.Kyuno; D.G.Cahill, D.G.Cahill; R.S.Averback, R.S.Averback; J.Tarus, J.Tarus; K.Nordlund, K.Nordlund; Kyuno, Kentaro.

In: Physical Review Letters, Vol. 83, 01.04.1999.

Research output: Contribution to journalArticle

K.Kyuno, KK, D.G.Cahill, DGC, R.S.Averback, RSA, J.Tarus, JT, K.Nordlund, KN & Kyuno, K 1999, 'Surface defects and bulk defect migration produced by ion bombardment of Si(001)', Physical Review Letters, vol. 83.
K.Kyuno KK, D.G.Cahill DGC, R.S.Averback RSA, J.Tarus JT, K.Nordlund KN, Kyuno K. Surface defects and bulk defect migration produced by ion bombardment of Si(001). Physical Review Letters. 1999 Apr 1;83.
K.Kyuno, K.Kyuno ; D.G.Cahill, D.G.Cahill ; R.S.Averback, R.S.Averback ; J.Tarus, J.Tarus ; K.Nordlund, K.Nordlund ; Kyuno, Kentaro. / Surface defects and bulk defect migration produced by ion bombardment of Si(001). In: Physical Review Letters. 1999 ; Vol. 83.
@article{d4bd3020d80f4bdc81644ce1136ef7a6,
title = "Surface defects and bulk defect migration produced by ion bombardment of Si(001)",
author = "K.Kyuno K.Kyuno and D.G.Cahill D.G.Cahill and R.S.Averback R.S.Averback and J.Tarus J.Tarus and K.Nordlund K.Nordlund and Kentaro Kyuno",
year = "1999",
month = "4",
day = "1",
language = "English",
volume = "83",
journal = "Physical Review Letters",
issn = "0031-9007",
publisher = "American Physical Society",

}

TY - JOUR

T1 - Surface defects and bulk defect migration produced by ion bombardment of Si(001)

AU - K.Kyuno, K.Kyuno

AU - D.G.Cahill, D.G.Cahill

AU - R.S.Averback, R.S.Averback

AU - J.Tarus, J.Tarus

AU - K.Nordlund, K.Nordlund

AU - Kyuno, Kentaro

PY - 1999/4/1

Y1 - 1999/4/1

M3 - Article

VL - 83

JO - Physical Review Letters

JF - Physical Review Letters

SN - 0031-9007

ER -