Synthesis, properties, and molecular structure analysis of SiO2 thin films prepared by sol-gel method

Sachiko Maekawa, Kojiro Okude, Tomoji Ohishi

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Abstract

SiO2 thin films were prepared by the sol-gel method. The properties of the films such as film thickness, etching rate in hydrofluoric acid, Vicker's hardness, and the effect of the thermal treatment on the molecular structure were investigated. As a result, it was found that the etching resistance and hardness were improved as the treatment temperature increased. These changes in the properties were related to the density and water content in the film. The molecular structure analysis by the 29Si solid-state NMR and Raman spectroscopy revealed that the unstable distorted Si-O-Si bonds formed in the solution were broken and stable straight Si-O-Si bonds were formed during the high-temperature treatment. As the number of the stable Si-O-Si bonds increases, the hardness and density of the films increases.

Original languageEnglish
Pages (from-to)86-92
Number of pages7
JournalElectronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)
Volume77
Issue number5
Publication statusPublished - 1994 May
Externally publishedYes

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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