TEM observation of interfaces between Y2BaCuO5 inclusions and the YBa2Cu3O7 matrix in melt-powder-melt-growth processed YBaCuO

Koji Yamaguchi, Masato Murakami, Hiroyuki Fujimoto, Satoshi Gotoh, Naoki Koshizuka, Shoji Tanaka

Research output: Contribution to journalArticle

33 Citations (Scopus)

Abstract

We have conducted transmission electron microscopic observations along the [001] direction of the interfaces between Y2BaCuO5 inclusions and the YBa2Cu3O7 matrix in the YBaCuO crystals fabricated by the Melt-Powder-Melt-Growth process. Amorphous layers about 1 nm in thickness are observed at some interfaces. We could not find observable crystallographic defects at the interfaces.

Original languageEnglish
Pages (from-to)1428-1431
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume29
Issue number8
Publication statusPublished - 1990 Aug
Externally publishedYes

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inclusions
Transmission electron microscopy
Powders
Defects
transmission electron microscopy
Crystals
Electrons
matrices
defects
crystals
electrons

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

TEM observation of interfaces between Y2BaCuO5 inclusions and the YBa2Cu3O7 matrix in melt-powder-melt-growth processed YBaCuO. / Yamaguchi, Koji; Murakami, Masato; Fujimoto, Hiroyuki; Gotoh, Satoshi; Koshizuka, Naoki; Tanaka, Shoji.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 29, No. 8, 08.1990, p. 1428-1431.

Research output: Contribution to journalArticle

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