We have conducted transmission electron microscopic observations along the  direction of the interfaces between Y2BaCuO5inclusions and the YBa2Cu3O7matrix in the YBaCuO crystals fabricated by the Melt-Powder-Melt-Growth process. Amorphous layers about 1 nm in thickness are observed at some interfaces. We could not find observable crystallographic defects at the interfaces.
- Melt-Powder-Meit-Growth process
- Transmission electron microscopy
ASJC Scopus subject areas
- Physics and Astronomy(all)