Texture analysis of monofilamentary, Ag-sheathed (Pb,Bi)2Sr2Ca2Cu3O x tapes by electron backscatter diffraction (EBSD)

A. Koblischka-Veneva, M. R. Koblischka, T. Qu, Z. Han, F. Mücklich

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


Using automated orientation imaging, the grain orientations and texture of monofilamentary, Ag-sheathed (Pb,Bi)2Sr2Ca2Cu3O x (Bi-2223) tape is analysed in detail by means of electron backscatter diffraction (EBSD). The achieved high image quality of the Kikuchi patterns enables multi-phase scans including Bi-2223, Bi2Sr2CaCu2Ox, Bi2Sr2CuOx, (Sr,Ca)14Cu24O41 and Ag to be performed. Two areas are selected for the EBSD analysis, one close to the silver sheath, the other located in the center of the sample. The grain orientation maps are presented for each phase separately allowing a new insight into the microtexture of Ag-sheathed Bi-2223 tapes. Furthermore, the EBSD analysis provides the possibility for a misorientation angle analysis within each individual phase.

Original languageEnglish
Pages (from-to)174-182
Number of pages9
JournalPhysica C: Superconductivity and its applications
Issue number3
Publication statusPublished - 2008 Feb 1
Externally publishedYes


  • 61.05.-j
  • 74.72.Hs
  • 74.81.Bd
  • Bi-2223 tapes
  • EBSD
  • Grain orientation
  • High-T superconductors
  • Multi-phase analysis

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering


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