TY - JOUR
T1 - The composition and poling-dependent photovoltaic studies in ferroelectric (Bi1−xSrx)(Fe1−xTix)O3 thin films
AU - Biswas, P. P.
AU - Thirmal, Ch
AU - Pal, S.
AU - Miryala, M.
AU - Murakami, M.
AU - Murugavel, P.
N1 - Funding Information:
The work is partially supported by Japan Student Services Organization (JASSO), Shibaura Institute of Technology (SIT) under the Top Global University Project, Designed by the Ministry of Education, Culture, Sports, Science, and Technology in Japan. We acknowledge Dr. C. Sudakar and Mr. S. Nandy for defused reflectance spectroscopy measurement.
Publisher Copyright:
© 2019, Springer Science+Business Media, LLC, part of Springer Nature.
PY - 2020/1/1
Y1 - 2020/1/1
N2 - The polycrystalline (Bi1−xSrx)(Fe1−xTix)O3 (x = 0.0, 0.05, 0.10, and 0.20) thin films were grown on Pt(111)/TiO2/SiO2/Si(100) substrates using chemical solution deposition technique. X-ray diffraction pattern revealed that pure BiFeO3 film is crystallized in rhombohedrally distorted crystal structure. However, the patterns for doped samples displayed a mixed-phase (rhombohedral + tetragonal) structure. The Raman studies revealed the emergence of B mode related to the tetragonal phase along with the modes corresponding to the rhombohedral phase in doped systems. The photovoltaic studies displayed a large photovoltaic response for the parent compound with an open-circuit voltage of 0.47 V. However, it showed a decrease in the photovoltaic response with an increase in composition x. The composition-dependent photovoltaic response could be correlated to the evolution of tetragonal phase fractions and the polarization. Additionally, the poling-dependent photovoltaic studies revealed the dominant role played by the polarization in comparison with the interface Schottky effect. This work gives an improved understanding of the ferroelectric photovoltaic mechanism and, therefore, may offer guidelines to design and optimize photovoltaic materials.
AB - The polycrystalline (Bi1−xSrx)(Fe1−xTix)O3 (x = 0.0, 0.05, 0.10, and 0.20) thin films were grown on Pt(111)/TiO2/SiO2/Si(100) substrates using chemical solution deposition technique. X-ray diffraction pattern revealed that pure BiFeO3 film is crystallized in rhombohedrally distorted crystal structure. However, the patterns for doped samples displayed a mixed-phase (rhombohedral + tetragonal) structure. The Raman studies revealed the emergence of B mode related to the tetragonal phase along with the modes corresponding to the rhombohedral phase in doped systems. The photovoltaic studies displayed a large photovoltaic response for the parent compound with an open-circuit voltage of 0.47 V. However, it showed a decrease in the photovoltaic response with an increase in composition x. The composition-dependent photovoltaic response could be correlated to the evolution of tetragonal phase fractions and the polarization. Additionally, the poling-dependent photovoltaic studies revealed the dominant role played by the polarization in comparison with the interface Schottky effect. This work gives an improved understanding of the ferroelectric photovoltaic mechanism and, therefore, may offer guidelines to design and optimize photovoltaic materials.
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U2 - 10.1007/s10854-019-02667-1
DO - 10.1007/s10854-019-02667-1
M3 - Article
AN - SCOPUS:85076363893
SN - 0957-4522
VL - 31
SP - 1515
EP - 1523
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 2
ER -