Abstract
User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.
| Original language | English |
|---|---|
| Article number | P-178 |
| Pages (from-to) | 390-393 |
| Number of pages | 4 |
| Journal | Digest of Technical Papers - SID International Symposium |
| Volume | 36 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2005 |
| Event | SID Symposium Digest of Technical Papers - Boston, MA, United States Duration: 2004 Jul 29 → 2004 Jul 29 |
ASJC Scopus subject areas
- Engineering(all)
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Hisatake, Y., Miyazaki, T., Yoshitake, R., & Nakano, Y. (2005). The number of sub-pixel defects that is acceptable for various panel size and pixel sizes. Digest of Technical Papers - SID International Symposium, 36(1), 390-393. [P-178]. https://doi.org/10.1889/1.2036454