Abstract
User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.
Original language | English |
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Title of host publication | Digest of Technical Papers - SID International Symposium |
Pages | 390-393 |
Number of pages | 4 |
Volume | 36 |
Edition | 1 |
DOIs | |
Publication status | Published - 2005 |
Externally published | Yes |
Event | SID Symposium Digest of Technical Papers - Boston, MA, United States Duration: 2004 Jul 29 → 2004 Jul 29 |
Other
Other | SID Symposium Digest of Technical Papers |
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Country | United States |
City | Boston, MA |
Period | 04/7/29 → 04/7/29 |
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ASJC Scopus subject areas
- Engineering(all)
Cite this
The number of sub-pixel defects that is acceptable for various panel size and pixel sizes. / Hisatake, Yuzo; Miyazaki, Tatsuya; Yoshitake, Ryoji; Nakano, Yoshihiko.
Digest of Technical Papers - SID International Symposium. Vol. 36 1. ed. 2005. p. 390-393 P-178.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - The number of sub-pixel defects that is acceptable for various panel size and pixel sizes
AU - Hisatake, Yuzo
AU - Miyazaki, Tatsuya
AU - Yoshitake, Ryoji
AU - Nakano, Yoshihiko
PY - 2005
Y1 - 2005
N2 - User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.
AB - User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.
UR - http://www.scopus.com/inward/record.url?scp=32144458945&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=32144458945&partnerID=8YFLogxK
U2 - 10.1889/1.2036454
DO - 10.1889/1.2036454
M3 - Conference contribution
AN - SCOPUS:32144458945
VL - 36
SP - 390
EP - 393
BT - Digest of Technical Papers - SID International Symposium
ER -