The number of sub-pixel defects that is acceptable for various panel size and pixel sizes

Yuzo Hisatake; Tatsuya Miyazaki; Ryoji Yoshitake; Yoshihiko Nakano

doi:10.1889/1.2036454

The number of sub-pixel defects that is acceptable for various panel size and pixel sizes

Yuzo Hisatake, Tatsuya Miyazaki, Ryoji Yoshitake, Yoshihiko Nakano

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.

Original language	English
Title of host publication	Digest of Technical Papers - SID International Symposium
Pages	390-393
Number of pages	4
Volume	36
Edition	1
DOIs	https://doi.org/10.1889/1.2036454
Publication status	Published - 2005
Externally published	Yes
Event	SID Symposium Digest of Technical Papers - Boston, MA, United States Duration: 2004 Jul 29 → 2004 Jul 29

Other

Other	SID Symposium Digest of Technical Papers
Country	United States
City	Boston, MA
Period	04/7/29 → 04/7/29

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ASJC Scopus subject areas

Engineering(all)

Cite this

Hisatake, Y., Miyazaki, T., Yoshitake, R., & Nakano, Y. (2005). The number of sub-pixel defects that is acceptable for various panel size and pixel sizes. In Digest of Technical Papers - SID International Symposium (1 ed., Vol. 36, pp. 390-393). [P-178] https://doi.org/10.1889/1.2036454

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Access to Document

10.1889/1.2036454