The number of sub-pixel defects that is acceptable for various panel size and pixel sizes

Yuzo Hisatake; Tatsuya Miyazaki; Ryoji Yoshitake; Yoshihiko Nakano

doi:10.1889/1.2036454

The number of sub-pixel defects that is acceptable for various panel size and pixel sizes

Yuzo Hisatake, Tatsuya Miyazaki, Ryoji Yoshitake, Yoshihiko Nakano

Research output: Contribution to journal › Conference article › peer-review

2 Citations (Scopus)

Abstract

User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.

Original language	English
Article number	P-178
Pages (from-to)	390-393
Number of pages	4
Journal	Digest of Technical Papers - SID International Symposium
Volume	36
Issue number	1
DOIs	https://doi.org/10.1889/1.2036454
Publication status	Published - 2005
Externally published	Yes
Event	SID Symposium Digest of Technical Papers - Boston, MA, United States Duration: 2004 Jul 29 → 2004 Jul 29

ASJC Scopus subject areas

Engineering(all)

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10.1889/1.2036454

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title = "The number of sub-pixel defects that is acceptable for various panel size and pixel sizes",

abstract = "User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.",

author = "Yuzo Hisatake and Tatsuya Miyazaki and Ryoji Yoshitake and Yoshihiko Nakano",

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AU - Yoshitake, Ryoji

AU - Nakano, Yoshihiko

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