The number of sub-pixel defects that is acceptable for various panel size and pixel sizes

Yuzo Hisatake, Tatsuya Miyazaki, Ryoji Yoshitake, Yoshihiko Nakano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

User's patience limit of pixel defects from each panel size and pixel size should differ. We investigated the influence of these parameters to the limit by subjectivity evaluation in the design viewing distance for each application. As results, the number decreased, so that panel size or pixel size were small.

Original languageEnglish
Title of host publicationDigest of Technical Papers - SID International Symposium
Pages390-393
Number of pages4
Volume36
Edition1
DOIs
Publication statusPublished - 2005
Externally publishedYes
EventSID Symposium Digest of Technical Papers - Boston, MA, United States
Duration: 2004 Jul 292004 Jul 29

Other

OtherSID Symposium Digest of Technical Papers
CountryUnited States
CityBoston, MA
Period04/7/2904/7/29

Fingerprint

Pixels
Defects

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Hisatake, Y., Miyazaki, T., Yoshitake, R., & Nakano, Y. (2005). The number of sub-pixel defects that is acceptable for various panel size and pixel sizes. In Digest of Technical Papers - SID International Symposium (1 ed., Vol. 36, pp. 390-393). [P-178] https://doi.org/10.1889/1.2036454

The number of sub-pixel defects that is acceptable for various panel size and pixel sizes. / Hisatake, Yuzo; Miyazaki, Tatsuya; Yoshitake, Ryoji; Nakano, Yoshihiko.

Digest of Technical Papers - SID International Symposium. Vol. 36 1. ed. 2005. p. 390-393 P-178.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hisatake, Y, Miyazaki, T, Yoshitake, R & Nakano, Y 2005, The number of sub-pixel defects that is acceptable for various panel size and pixel sizes. in Digest of Technical Papers - SID International Symposium. 1 edn, vol. 36, P-178, pp. 390-393, SID Symposium Digest of Technical Papers, Boston, MA, United States, 04/7/29. https://doi.org/10.1889/1.2036454
Hisatake Y, Miyazaki T, Yoshitake R, Nakano Y. The number of sub-pixel defects that is acceptable for various panel size and pixel sizes. In Digest of Technical Papers - SID International Symposium. 1 ed. Vol. 36. 2005. p. 390-393. P-178 https://doi.org/10.1889/1.2036454
Hisatake, Yuzo ; Miyazaki, Tatsuya ; Yoshitake, Ryoji ; Nakano, Yoshihiko. / The number of sub-pixel defects that is acceptable for various panel size and pixel sizes. Digest of Technical Papers - SID International Symposium. Vol. 36 1. ed. 2005. pp. 390-393
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