Theoretical description of the high-frequency magnetic force microscopy technique

Michael R. Koblischka; Uwe Hartmann

doi:10.1109/TMAG.2009.2021985

Theoretical description of the high-frequency magnetic force microscopy technique

Michael R. Koblischka, Uwe Hartmann

Research output: Contribution to journal › Article

6 Citations (Scopus)

Abstract

We present a theoretical description of the high-frequency magnetic force microscopy (HF-MFM) technique. There are currently two operation modes: 1) the measurement of high-frequency currents via their magnetic stray fields and 2) the measurement of stray fields emanating from hard disk writer poles. The advanced HF-MFM technique employs the amplitude-modulation technique in order to convert the HF signal to the frequency range of the cantilever. Using the point-dipole approximation, we calculate the resulting force onto the cantilever for both cases.

Original language	English
Article number	5208492
Pages (from-to)	3228-3232
Number of pages	5
Journal	IEEE Transactions on Magnetics
Volume	45
Issue number	9
DOIs	https://doi.org/10.1109/TMAG.2009.2021985
Publication status	Published - 2009 Sep 1

Keywords

Frequency characteristics
Hard disk write head
High-frequency measurement
Magnetic force microscope

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1109/TMAG.2009.2021985

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Koblischka, M. R., & Hartmann, U. (2009). Theoretical description of the high-frequency magnetic force microscopy technique. IEEE Transactions on Magnetics, 45(9), 3228-3232. [5208492]. https://doi.org/10.1109/TMAG.2009.2021985

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