Theoretical description of the high-frequency magnetic force microscopy technique

Michael R. Koblischka, Uwe Hartmann

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We present a theoretical description of the high-frequency magnetic force microscopy (HF-MFM) technique. There are currently two operation modes: 1) the measurement of high-frequency currents via their magnetic stray fields and 2) the measurement of stray fields emanating from hard disk writer poles. The advanced HF-MFM technique employs the amplitude-modulation technique in order to convert the HF signal to the frequency range of the cantilever. Using the point-dipole approximation, we calculate the resulting force onto the cantilever for both cases.

Original languageEnglish
Article number5208492
Pages (from-to)3228-3232
Number of pages5
JournalIEEE Transactions on Magnetics
Volume45
Issue number9
DOIs
Publication statusPublished - 2009 Sep 1
Externally publishedYes

Keywords

  • Frequency characteristics
  • Hard disk write head
  • High-frequency measurement
  • Magnetic force microscope

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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