Thermal Analysis on Double-Crucible Method in Continuous Silicon CZ Technology I

Naoki Ono, Michio Kida, Yoshiaki Arai, Kensho Sahira

Research output: Contribution to journalArticle

7 Citations (Scopus)
Original languageEnglish
Pages (from-to)2101-2105
JournalJournal of the Electrochemical Society
Volume140
Publication statusPublished - 1993 Jul 1

Cite this

Thermal Analysis on Double-Crucible Method in Continuous Silicon CZ Technology I. / Ono, Naoki; Kida, Michio; Arai, Yoshiaki; Sahira, Kensho.

In: Journal of the Electrochemical Society, Vol. 140, 01.07.1993, p. 2101-2105.

Research output: Contribution to journalArticle

Ono, Naoki ; Kida, Michio ; Arai, Yoshiaki ; Sahira, Kensho. / Thermal Analysis on Double-Crucible Method in Continuous Silicon CZ Technology I. In: Journal of the Electrochemical Society. 1993 ; Vol. 140. pp. 2101-2105.
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