Thermal fatigue damage of quad flat pack leads and Sn-3.5Ag-X (X=Bi and Cu) solder joints

K. Warashina, Y. Kariya, Y. Hirata, M. Otsuka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Thermal fatigue damage of quad flat pack leads and Sn-3.5Ag-X (X=Bi and Cu) solder joints'. Together they form a unique fingerprint.

Engineering & Materials Science