Three-dimensional analysis of nanoparticles by using annular dark-field scanning confocal electron microscopy - Established in a double aberration-corrected microscope

A. Hashimoto, P. Wang, M. Shimojo, K. Mitsuishi, A. I. Kirkl, P. D. Nellist, M. Takeguchi

Research output: Contribution to journalArticle

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2010 Jun 1

Cite this

Three-dimensional analysis of nanoparticles by using annular dark-field scanning confocal electron microscopy - Established in a double aberration-corrected microscope. / Hashimoto, A.; Wang, P.; Shimojo, M.; Mitsuishi, K.; Kirkl, A. I.; Nellist, P. D.; Takeguchi, M.

In: Default journal, 01.06.2010.

Research output: Contribution to journalArticle

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AU - Kirkl, A. I.

AU - Nellist, P. D.

AU - Takeguchi, M.

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