Three-dimensional analysis of nanoparticles by using annular dark-field scanning confocal electron microscopy - Established in a double aberration-corrected microscope

A. Hashimoto; P. Wang; M. Shimojo; K. Mitsuishi; A. I. Kirkl; P. D. Nellist; M. Takeguchi

Three-dimensional analysis of nanoparticles by using annular dark-field scanning confocal electron microscopy - Established in a double aberration-corrected microscope

A. Hashimoto, P. Wang, M. Shimojo, K. Mitsuishi, A. I. Kirkl, P. D. Nellist, M. Takeguchi

Functional Control Systems

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Default journal
Publication status	Published - 2010 Jun 1

Cite this

@article{4054c6d5d1de4bdb91b06e18041cce15,

title = "Three-dimensional analysis of nanoparticles by using annular dark-field scanning confocal electron microscopy - Established in a double aberration-corrected microscope",

author = "A. Hashimoto and P. Wang and M. Shimojo and K. Mitsuishi and Kirkl, {A. I.} and Nellist, {P. D.} and M. Takeguchi",

year = "2010",

month = jun,

day = "1",

language = "English",

journal = "Default journal",

}

TY - JOUR

T1 - Three-dimensional analysis of nanoparticles by using annular dark-field scanning confocal electron microscopy - Established in a double aberration-corrected microscope

AU - Hashimoto, A.

AU - Wang, P.

AU - Shimojo, M.

AU - Mitsuishi, K.

AU - Kirkl, A. I.

AU - Nellist, P. D.

AU - Takeguchi, M.

PY - 2010/6/1

Y1 - 2010/6/1

M3 - Article

JO - Default journal

JF - Default journal

ER -