Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy

Ayako Hashimoto, Peng Wang, Masayuki Shimojo, Kazutaka Mitsuishi, Peter D. Nellist, Angus I. Kirkland, Masaki Takeguchi

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

We observed Pt nanoparticles on carbon nanohorn aggregates by annular dark-field scanning confocal electron microscopy (ADF-SCEM) with an aberration-corrected microscope for three-dimensional (3D) imaging. The object elongation length along an optical axis that corresponds to the depth resolution was independent of the lateral size. Furthermore, the nanoparticle elongation length was reduced to 34 nm as compared with that by an uncorrected microscope. Hence, aberration-corrected ADF-SCEM provides structural information not only on the nanoparticles but also on the large carbon supports such as projecting nanohorns and hollow structures. Finally, aberration-corrected ADF-SCEM is effective for the 3D analysis of nanoparticle-supported composites.

Original languageEnglish
Article number253108
JournalApplied Physics Letters
Volume101
Issue number25
DOIs
Publication statusPublished - 2012 Dec 17

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dimensional analysis
aberration
nanoparticles
scanning electron microscopy
carbon
elongation
microscopes
hollow
composite materials

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy. / Hashimoto, Ayako; Wang, Peng; Shimojo, Masayuki; Mitsuishi, Kazutaka; Nellist, Peter D.; Kirkland, Angus I.; Takeguchi, Masaki.

In: Applied Physics Letters, Vol. 101, No. 25, 253108, 17.12.2012.

Research output: Contribution to journalArticle

Hashimoto, Ayako ; Wang, Peng ; Shimojo, Masayuki ; Mitsuishi, Kazutaka ; Nellist, Peter D. ; Kirkland, Angus I. ; Takeguchi, Masaki. / Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy. In: Applied Physics Letters. 2012 ; Vol. 101, No. 25.
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