Original language | English |
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Pages (from-to) | 159-169 |
Journal | J. Electron Microsc. |
Volume | 61 |
Publication status | Published - 2012 Dec 1 |
Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy
X. Zhang, X. Zhang;M.Takeguchi;A.Hashimoto;K.Mitsuishi;P.Wang;P Kirkl, ;M. Tezuka;M. Shimojo
Research output: Contribution to journal › Article › peer-review
7
Citations
(Scopus)