Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy

X. Zhang, X. Zhang;M.Takeguchi;A.Hashimoto;K.Mitsuishi;P.Wang;P Kirkl, ;M. Tezuka;M. Shimojo

Research output: Contribution to journalArticle

6 Citations (Scopus)
Original languageEnglish
Pages (from-to)159-169
JournalJ. Electron Microsc.
Volume61
Publication statusPublished - 2012 Dec 1

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