Abstract
We report on three-dimensional (3D) holographic recording in As 2S3 glass using 800 nm wavelength, 150 fs duration pulses. Diffractive beam splitter was used to generate 2-5 beams which were then focused for recording by objective lens of numerical aperture NA = 0.75. The recorded 3D hologram was read out by diffraction of 632 nm HeNe laser beam confirming the expected pattern of holograms. The mechanism of photo-darkening and optical damaging of As2S3 glass and dielectrics in general is discussed. Two-photon absorption cross-section, σ2 = 74.6 × 10-50 cm4/s, was determined by transmission for pulses of 150 fs and 800 nm wavelength. Also, it is demonstrated that the optical damage threshold scales as the bandgap energy for the fluorides. Nano-/ micro-structuring of As2S3 glass by ablation in air will be also demonstrated. High fluence (> 5 J/cm2) irradiation of the 800 nm wavelength, 150 fs duration pulses was used to ablate As 2S3 glass. Self-organized growth of the fibers, rods, and microsphere-type structures was observed. Composition of the nano-/micro-structured material was close to that of the source As 2S3 glass (with up to 20% surplus of sulphur in nano-rods). Straight rods as thin as 20 nm in diameter and over 1 μm-long were obtained. Application potential of nano-/micro-structured As 2S3 glass is discussed.
Original language | English |
---|---|
Article number | 29 |
Pages (from-to) | 179-184 |
Number of pages | 6 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 5662 |
DOIs | |
Publication status | Published - 2004 |
Externally published | Yes |
Event | Fifth International Symposium on Laser Precision Microfabrication - Nara, Japan Duration: 2004 May 11 → 2004 May 14 |
Keywords
- AsS
- Chalcogenide glass
- Holographic recording
- Light-induced damage threshold
- Photonic crystals
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering