Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy

P. D. Nellist; P. Wang; G. Behan; A. I. Kirkl; A. Hashimoto; M. Shimojo; K. Mitsuishi; M. Takeguchi; E. C. Cosgriff; A. J. D'Alfonso; L. J. Allen; S. J. Findlay

Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy

P. D. Nellist, P. Wang, G. Behan, A. I. Kirkl, A. Hashimoto, M. Shimojo, K. Mitsuishi, M. Takeguchi, E. C. Cosgriff, A. J. D'Alfonso, L. J. Allen, S. J. Findlay

Functional Control Systems

Research output: Contribution to journal › Article

Original language	English
Journal	Default journal
Publication status	Published - 2010 Aug 1

Cite this

Nellist, P. D., Wang, P., Behan, G., Kirkl, A. I., Hashimoto, A., Shimojo, M., Mitsuishi, K., Takeguchi, M., Cosgriff, E. C., D'Alfonso, A. J., Allen, L. J., & Findlay, S. J. (2010). Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy. Default journal.

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author = "Nellist, {P. D.} and P. Wang and G. Behan and Kirkl, {A. I.} and A. Hashimoto and M. Shimojo and K. Mitsuishi and M. Takeguchi and Cosgriff, {E. C.} and D'Alfonso, {A. J.} and Allen, {L. J.} and Findlay, {S. J.}",

year = "2010",

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T1 - Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy

AU - Nellist, P. D.

AU - Wang, P.

AU - Behan, G.

AU - Kirkl, A. I.

AU - Hashimoto, A.

AU - Shimojo, M.

AU - Mitsuishi, K.

AU - Takeguchi, M.

AU - Cosgriff, E. C.

AU - D'Alfonso, A. J.

AU - Allen, L. J.

AU - Findlay, S. J.

PY - 2010/8/1

Y1 - 2010/8/1

M3 - Article

JO - Default journal

JF - Default journal

ER -