Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy

P. D. Nellist, P. Wang, G. Behan, A. I. Kirkl, A. Hashimoto, M. Shimojo, K. Mitsuishi, M. Takeguchi, E. C. Cosgriff, A. J. D'Alfonso, L. J. Allen, S. J. Findlay

Research output: Contribution to journalArticle

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2010 Aug 1

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Nellist, P. D., Wang, P., Behan, G., Kirkl, A. I., Hashimoto, A., Shimojo, M., Mitsuishi, K., Takeguchi, M., Cosgriff, E. C., D'Alfonso, A. J., Allen, L. J., & Findlay, S. J. (2010). Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy. Default journal.