Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy

P. D. Nellist, P. Wang, G. Behan, A. I. Kirkl, A. Hashimoto, M. Shimojo, K. Mitsuishi, M. Takeguchi, E. C. Cosgriff, A. J. D'Alfonso, L. J. Allen, S. J. Findlay

Research output: Contribution to journalArticle

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2010 Aug 1

Cite this

Nellist, P. D., Wang, P., Behan, G., Kirkl, A. I., Hashimoto, A., Shimojo, M., ... Findlay, S. J. (2010). Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy. Default journal.

Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy. / Nellist, P. D.; Wang, P.; Behan, G.; Kirkl, A. I.; Hashimoto, A.; Shimojo, M.; Mitsuishi, K.; Takeguchi, M.; Cosgriff, E. C.; D'Alfonso, A. J.; Allen, L. J.; Findlay, S. J.

In: Default journal, 01.08.2010.

Research output: Contribution to journalArticle

Nellist, PD, Wang, P, Behan, G, Kirkl, AI, Hashimoto, A, Shimojo, M, Mitsuishi, K, Takeguchi, M, Cosgriff, EC, D'Alfonso, AJ, Allen, LJ & Findlay, SJ 2010, 'Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy', Default journal.
Nellist, P. D. ; Wang, P. ; Behan, G. ; Kirkl, A. I. ; Hashimoto, A. ; Shimojo, M. ; Mitsuishi, K. ; Takeguchi, M. ; Cosgriff, E. C. ; D'Alfonso, A. J. ; Allen, L. J. ; Findlay, S. J. / Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy. In: Default journal. 2010.
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AU - Wang, P.

AU - Behan, G.

AU - Kirkl, A. I.

AU - Hashimoto, A.

AU - Shimojo, M.

AU - Mitsuishi, K.

AU - Takeguchi, M.

AU - Cosgriff, E. C.

AU - D'Alfonso, A. J.

AU - Allen, L. J.

AU - Findlay, S. J.

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