Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy

P. D. Nellist; P. Wang; G. Behan; A. I. Kirkl; A. Hashimoto; M. Shimojo; K. Mitsuishi; M. Takeguchi; E. C. Cosgriff; A. J. D'Alfonso; L. J. Allen; S. J. Findlay

Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy

P. D. Nellist, P. Wang, G. Behan, A. I. Kirkl, A. Hashimoto, M. Shimojo, K. Mitsuishi, M. Takeguchi, E. C. Cosgriff, A. J. D'Alfonso, L. J. Allen, S. J. Findlay

Functional Control Systems

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Default journal
Publication status	Published - 2010 Aug 1

Cite this

Three-dimensional resolution limits and image contrast mechanisms in scanning confocal electron microscopy. / Nellist, P. D.; Wang, P.; Behan, G.; Kirkl, A. I.; Hashimoto, A.; Shimojo, M.; Mitsuishi, K.; Takeguchi, M.; Cosgriff, E. C.; D'Alfonso, A. J.; Allen, L. J.; Findlay, S. J.

In: Default journal, 01.08.2010.

Research output: Contribution to journal › Article › peer-review

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AU - Nellist, P. D.

AU - Wang, P.

AU - Behan, G.

AU - Kirkl, A. I.

AU - Hashimoto, A.

AU - Shimojo, M.

AU - Mitsuishi, K.

AU - Takeguchi, M.

AU - Cosgriff, E. C.

AU - D'Alfonso, A. J.

AU - Allen, L. J.

AU - Findlay, S. J.

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