Two-beam X-ray interferometer using diffraction in multiple Bragg-Laue mode

Tomoe Fukamachi, Sukswat Jongsukswat, Yoshinobu Kanematsu, Kenji Hirano, Riichirou Negishi, Masayuki Shimojo, Dongying Ju, Keiichi Hirano, Takaaki Kawamura

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2 Citations (Scopus)

Abstract

A novel two-beam X-ray interferometer using two multiple Bragg-Laue (MBL) mode interferometers has been developed. The first MBL interferometer was utilized not only as a monochromator to generate a highly coherent beam but also as a beam splitter. The second MBL interferometer was used as an analyzer. By using this two-beam X-ray interferometer, interference fringes were observed as a function of the thickness of a phase plate inserted in one path of incident X-rays. The visibility of the measured fringes is approximately 25%. Some advantages of this MBL interferometer are pointed out.

Original languageEnglish
Article number083001
JournalJournal of the Physical Society of Japan
Volume80
Issue number8
DOIs
Publication statusPublished - 2011 Aug 1

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Keywords

  • Beam splitter
  • Bragg-Laue diffraction
  • Interference fringe
  • Monochromator
  • Phase contrast
  • X-ray interferometer

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Fukamachi, T., Jongsukswat, S., Kanematsu, Y., Hirano, K., Negishi, R., Shimojo, M., Ju, D., Hirano, K., & Kawamura, T. (2011). Two-beam X-ray interferometer using diffraction in multiple Bragg-Laue mode. Journal of the Physical Society of Japan, 80(8), [083001]. https://doi.org/10.1143/JPSJ.80.083001