Two-dimensional analysis of cutoff frequencies of GaAs MESFETs with various substrate conditions

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Abstract

Cutoff frequencies of GaAs MESFETs are simulated by using a model that considers impurity compensation by deep levels in the semi-insulating (SI) substrate. For a higher acceptor-density SI substrate, an achievable cutoff frequency becomes higher because the substrate current becomes smaller. Effects of introducing a p-buffer layer are also studied in terms of dependencies on p-layer thickness and its doping density.

Original languageEnglish
Pages (from-to)230-237
Number of pages8
JournalInternational Journal of Microwave and Millimeter-Wave Computer-Aided Engineering
Volume3
Issue number3
Publication statusPublished - 1993 Jul

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Cutoff frequency
Substrates
Buffer layers
Doping (additives)
Impurities

ASJC Scopus subject areas

  • Engineering(all)

Cite this

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title = "Two-dimensional analysis of cutoff frequencies of GaAs MESFETs with various substrate conditions",
abstract = "Cutoff frequencies of GaAs MESFETs are simulated by using a model that considers impurity compensation by deep levels in the semi-insulating (SI) substrate. For a higher acceptor-density SI substrate, an achievable cutoff frequency becomes higher because the substrate current becomes smaller. Effects of introducing a p-buffer layer are also studied in terms of dependencies on p-layer thickness and its doping density.",
author = "Kazushige Horio",
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