Two-dimensional analysis of field-plate effects on surface state-related current transients and power slump in GaAs FETs

K. Horio, T. Tanaka, K. Itagaki, A. Nakajima

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)
Original languageEnglish
Pages (from-to)698-703
JournalIEEE Trans. Electron Devices
Volume58
Publication statusPublished - 2011 Mar 1

Cite this