Two-dimensional analysis of field-plate effects on surface state-related current transients and power slump in GaAs FETs

K. Horio, T. Tanaka, K. Itagaki, A. Nakajima

Research output: Contribution to journalArticle

24 Citations (Scopus)
Original languageEnglish
Pages (from-to)698-703
JournalIEEE Trans. Electron Devices
Volume58
Publication statusPublished - 2011 Mar 1

Cite this

Two-dimensional analysis of field-plate effects on surface state-related current transients and power slump in GaAs FETs. / Horio, K.; Tanaka, T.; Itagaki, K.; Nakajima, A.

In: IEEE Trans. Electron Devices, Vol. 58, 01.03.2011, p. 698-703.

Research output: Contribution to journalArticle

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