Two-Dimensional Analysis of Substrate-Trap Effects on Turn-on Characteristics in GaAs MESFET`s

K.Horio K.Horio, A.Wakabayashi A.Wakabayashi, T.Yamada T.Yamada, Kazushige Horio

Research output: Contribution to journalArticle

28 Citations (Scopus)
Original languageEnglish
Pages (from-to)617-624
JournalIEEE Trans. Electron Devices
Volume47
Publication statusPublished - 2000 Mar 1

Cite this

Two-Dimensional Analysis of Substrate-Trap Effects on Turn-on Characteristics in GaAs MESFET`s. / K.Horio, K.Horio; A.Wakabayashi, A.Wakabayashi; T.Yamada, T.Yamada; Horio, Kazushige.

In: IEEE Trans. Electron Devices, Vol. 47, 01.03.2000, p. 617-624.

Research output: Contribution to journalArticle

K.Horio, K.Horio ; A.Wakabayashi, A.Wakabayashi ; T.Yamada, T.Yamada ; Horio, Kazushige. / Two-Dimensional Analysis of Substrate-Trap Effects on Turn-on Characteristics in GaAs MESFET`s. In: IEEE Trans. Electron Devices. 2000 ; Vol. 47. pp. 617-624.
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