Two-Dimensional Analysis of Substrate-Trap Effects on Turn-on Characteristics in GaAs MESFET`s

K.Horio K.Horio, A.Wakabayashi A.Wakabayashi, T.Yamada T.Yamada, Kazushige Horio

Research output: Contribution to journalArticle

28 Citations (Scopus)
Original languageEnglish
Pages (from-to)617-624
JournalIEEE Trans. Electron Devices
Volume47
Publication statusPublished - 2000 Mar 1

Cite this

K.Horio, K. H., A.Wakabayashi, A. W., T.Yamada, T. Y., & Horio, K. (2000). Two-Dimensional Analysis of Substrate-Trap Effects on Turn-on Characteristics in GaAs MESFET`s. IEEE Trans. Electron Devices, 47, 617-624.