Two-Dimensional Simulation of Deep-Trap Effects in GaAs MESFETs with Different Types of Surface States

K.Horio K.Horio, K.Satoh K.Satoh, T.Yamada T.Yamada, Kazushige Horio

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	78-81
Journal	Proceedings of SISDEP’95, Erlangen, Germany
Publication status	Published - 1995 Sept 1

Cite this

@article{e0df92e5f89b4a5c9cea4b02921fe636,

title = "Two-Dimensional Simulation of Deep-Trap Effects in GaAs MESFETs with Different Types of Surface States",

author = "K.Horio K.Horio and K.Satoh K.Satoh and T.Yamada T.Yamada and Kazushige Horio",

year = "1995",

month = sep,

day = "1",

language = "English",

pages = "78--81",

journal = "Proceedings of SISDEP{\textquoteright}95, Erlangen, Germany",

}

TY - JOUR

T1 - Two-Dimensional Simulation of Deep-Trap Effects in GaAs MESFETs with Different Types of Surface States

AU - K.Horio, K.Horio

AU - K.Satoh, K.Satoh

AU - T.Yamada, T.Yamada

AU - Horio, Kazushige

PY - 1995/9/1

Y1 - 1995/9/1

M3 - Article

SP - 78

EP - 81

JO - Proceedings of SISDEP’95, Erlangen, Germany

JF - Proceedings of SISDEP’95, Erlangen, Germany

ER -