Two-Dimensional Simulation of Deep-Trap Effects in GaAs MESFETs with Different Types of Surface States

K.Horio K.Horio, K.Satoh K.Satoh, T.Yamada T.Yamada, Kazushige Horio

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)78-81
JournalProceedings of SISDEP’95, Erlangen, Germany
Publication statusPublished - 1995 Sep 1

Cite this