Two-Dimensional Simulation of Gate-Lag Phenomena in GaAs MESFETs and AlGaAs/GaAs HEMTs

K.Horio K.Horio, A.Wakabayashi A.Wakabayashi, N.Kurosawa N.Kurosawa, Kazushige Horio

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)339-342
JournalProceedings of ISCS'99, Berlin, Germany
Publication statusPublished - 1999 Aug 1

Cite this