Two-Dimensional Simulations of GaAs MESFETs Including Impact Ionization of Carriers and Carrier Trapping in the Semi-insulating Substrate

K. Horio, K. Satoh, H. Kusuki

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)100-101
JournalProceedings of 1993 VPAD, Nara, Japan
Publication statusPublished - 1993 May 1

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