Valence Band Discontinuity at the AlN/Si Interface

H. Ishikawa, B. Zhang, T. Egawa, T.Jimbo T.Jimbo

Research output: Contribution to journalArticlepeer-review

21 Citations (Scopus)
Original languageEnglish
Pages (from-to)6413-6414
JournalJpn. J. Appl. Phys.
Volume42
Publication statusPublished - 2003 Oct 1

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