| Original language | English |
|---|---|
| Pages (from-to) | 6413-6414 |
| Journal | Jpn. J. Appl. Phys. |
| Volume | 42 |
| Publication status | Published - 2003 Oct 1 |
Valence Band Discontinuity at the AlN/Si Interface
H. Ishikawa, B. Zhang, T. Egawa, T.Jimbo T.Jimbo
Research output: Contribution to journal › Article › peer-review
22
Citations
(Scopus)