X-ray interference fringes from weakly bent crystal

Tomoe Fukamachi, Sukswat Jongsukswat, Yoshinobu Kanematsu, Kenji Hirano, Riichirou Negishi, Masayuki Shimojo, Dongying Ju, Keiichi Hirano, Takaaki Kawamura

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Topographies of Si 220 reflection in the Bragg mode have been observed from a weakly bent single crystal. When bending is very weak, a novel interference fringe is observed instead of mirage diffraction fringes. The period of this fringe increases with the distance between the incident point of X-rays and the exit point of the diffracted beam. This interference fringe is caused by the interference between a mirage diffraction beam and the reflected beam from the bottom surface. When this interference fringe is observed, the interference fringes are also observed from the lateral surface even when the distance from the incident point to the crystal edge is 12 mm; X-rays propagate over a long distance, i.e., over a centimeter distance in the crystal.

Original languageEnglish
Article number083002
JournalJournal of the Physical Society of Japan
Volume80
Issue number8
DOIs
Publication statusPublished - 2011 Aug 1

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Keywords

  • Anomalous transmission
  • Bent crystal
  • Bragg-Laue diffraction
  • Interference fringe
  • Mirage fringe
  • X-ray topography

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Fukamachi, T., Jongsukswat, S., Kanematsu, Y., Hirano, K., Negishi, R., Shimojo, M., Ju, D., Hirano, K., & Kawamura, T. (2011). X-ray interference fringes from weakly bent crystal. Journal of the Physical Society of Japan, 80(8), [083002]. https://doi.org/10.1143/JPSJ.80.083002