xNumerical analysis of buffer-trap effects on gate lag in AlGaN/GaN high electron mobility transistors

Atsushi Nakajima, Kunitaka Fujii, Kazushige Horio

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Fingerprint

Dive into the research topics of 'xNumerical analysis of buffer-trap effects on gate lag in AlGaN/GaN high electron mobility transistors'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy