-1/+0.8°C error, accurate temperature sensor using 90nm IV CMOS for on-line thermal monitoring of VLSI circuits

Masahiro Sasaki, Makoto Ikeda, Kunihiro Asada

研究成果: Conference contribution

5 引用 (Scopus)

抄録

This paper proposes quite accurate four-transistor temperature sensor designed and developed for thermal testing and monitoring of VLSI circuits. The sensor is featured with an extremely small area of 11.6×4.1 μm 2 and low power consumption of about 25 μW. The performance of the sensor is highly linear and the predicted temperature error is merely -1.0-+0.8°C using two-point calibration within the range of 50 - 125°C. The sensor is implemented in ASPLA CMOS 90nm 1P6M process, operated at supply voltage of IV, and tested successfully.

元の言語English
ホスト出版物のタイトルIEEE International Conference on Microelectronic Test Structures
ページ9-12
ページ数4
2006
DOI
出版物ステータスPublished - 2006
外部発表Yes
イベント2006 International Conference on Microelectronic Test Structures - Austin, TX
継続期間: 2006 3 62006 3 9

Other

Other2006 International Conference on Microelectronic Test Structures
Austin, TX
期間06/3/606/3/9

Fingerprint

VLSI circuits
Temperature sensors
Monitoring
Sensors
Transistors
Electric power utilization
Calibration
Testing
Electric potential
Hot Temperature
Temperature

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

これを引用

Sasaki, M., Ikeda, M., & Asada, K. (2006). -1/+0.8°C error, accurate temperature sensor using 90nm IV CMOS for on-line thermal monitoring of VLSI circuits. : IEEE International Conference on Microelectronic Test Structures (巻 2006, pp. 9-12). [1614264] https://doi.org/10.1109/ICMTS.2006.1614264

-1/+0.8°C error, accurate temperature sensor using 90nm IV CMOS for on-line thermal monitoring of VLSI circuits. / Sasaki, Masahiro; Ikeda, Makoto; Asada, Kunihiro.

IEEE International Conference on Microelectronic Test Structures. 巻 2006 2006. p. 9-12 1614264.

研究成果: Conference contribution

Sasaki, M, Ikeda, M & Asada, K 2006, -1/+0.8°C error, accurate temperature sensor using 90nm IV CMOS for on-line thermal monitoring of VLSI circuits. : IEEE International Conference on Microelectronic Test Structures. 巻. 2006, 1614264, pp. 9-12, 2006 International Conference on Microelectronic Test Structures, Austin, TX, 06/3/6. https://doi.org/10.1109/ICMTS.2006.1614264
Sasaki M, Ikeda M, Asada K. -1/+0.8°C error, accurate temperature sensor using 90nm IV CMOS for on-line thermal monitoring of VLSI circuits. : IEEE International Conference on Microelectronic Test Structures. 巻 2006. 2006. p. 9-12. 1614264 https://doi.org/10.1109/ICMTS.2006.1614264
Sasaki, Masahiro ; Ikeda, Makoto ; Asada, Kunihiro. / -1/+0.8°C error, accurate temperature sensor using 90nm IV CMOS for on-line thermal monitoring of VLSI circuits. IEEE International Conference on Microelectronic Test Structures. 巻 2006 2006. pp. 9-12
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