-1/+0.8°C error, accurate temperature sensor using 90nm IV CMOS for on-line thermal monitoring of VLSI circuits

Masahiro Sasaki, Makoto Ikeda, Kunihiro Asada

研究成果: Conference contribution

5 被引用数 (Scopus)

抄録

This paper proposes quite accurate four-transistor temperature sensor designed and developed for thermal testing and monitoring of VLSI circuits. The sensor is featured with an extremely small area of 11.6×4.1 μm 2 and low power consumption of about 25 μW. The performance of the sensor is highly linear and the predicted temperature error is merely -1.0-+0.8°C using two-point calibration within the range of 50 - 125°C. The sensor is implemented in ASPLA CMOS 90nm 1P6M process, operated at supply voltage of IV, and tested successfully.

本文言語English
ホスト出版物のタイトル2006 International Conference on Microelectronic Test Structures - Digest of Technical Papers
ページ9-12
ページ数4
DOI
出版ステータスPublished - 2006 10 13
外部発表はい
イベント2006 International Conference on Microelectronic Test Structures - Austin, TX, United States
継続期間: 2006 3 62006 3 9

出版物シリーズ

名前IEEE International Conference on Microelectronic Test Structures
2006

Conference

Conference2006 International Conference on Microelectronic Test Structures
CountryUnited States
CityAustin, TX
Period06/3/606/3/9

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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