40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip

Masahiro Sasaki, Takuro Inoue, Makoto Ikeda, Kunihiro Asada

研究成果: Conference contribution

抜粋

This paper presents a 16×16 temperature probe array using 90nm 1V CMOS, which shows ±1.4°C error for 40 ∼ 110°C temperature range and achieves a temperature distribution measurement at 40 frames/sec. This array is designed and developed for an operating frequency and supply voltage feedback system corresponding to temperature of each block on a VLSI chip. The continuous thermal monitoring is performed by using accurate four-transistor temperature probe circuits with an error amplifier and two PMOS current sources.

元の言語English
ホスト出版物のタイトル2007 IEEE Asian Solid-State Circuits Conference, A-SSCC
ページ264-267
ページ数4
DOI
出版物ステータスPublished - 2007 12 1
イベント2007 IEEE Asian Solid-State Circuits Conference, A-SSCC - Jeju, Korea, Republic of
継続期間: 2007 11 122007 11 14

出版物シリーズ

名前2007 IEEE Asian Solid-State Circuits Conference, A-SSCC

Conference

Conference2007 IEEE Asian Solid-State Circuits Conference, A-SSCC
Korea, Republic of
Jeju
期間07/11/1207/11/14

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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  • これを引用

    Sasaki, M., Inoue, T., Ikeda, M., & Asada, K. (2007). 40 frames/sec 16×16 temperature probe array using 90nm 1V CMOS for on-line thermal monitoring on VLSI chip. : 2007 IEEE Asian Solid-State Circuits Conference, A-SSCC (pp. 264-267). [4425781] (2007 IEEE Asian Solid-State Circuits Conference, A-SSCC). https://doi.org/10.1109/ASSCC.2007.4425781