A high-Throughput screening system for thermoelectric material exploration based on a combinatorial film approach

Makoto Otani; Evan L. Thomas; Winnie Wong-Ng; Peter K. Schenck; Kao Shuo Chang; Nathan D. Lowhorn; Martin L. Green; Hiroyuki Ohguchi

doi:10.1143/jjAP.48.05EB02

A high-Throughput screening system for thermoelectric material exploration based on a combinatorial film approach

Makoto Otani, Evan L. Thomas, Winnie Wong-Ng, Peter K. Schenck, Kao Shuo Chang, Nathan D. Lowhorn, Martin L. Green, Hiroyuki Ohguchi

応用化学科

研究成果: Article

9 被引用数 (Scopus)

抄録

A high-throughput system that consists of a combinatorial tool (a sputtering deposition tool and a pulsed laser deposition tool) and two developed property screening devices was used for thermoelectric material exploration. The thermoelectric power factor (S²ν, S = Seebeck coefficient, ν = electrical conductivity) screening device allows us to measure electrical conductivity and Seebeck coefficient of over 1000 sample-points within 6h. The thermal effusivity measurement system using the frequency domain thermoreflectance technique allows us to screen thermal conductivity of combinatorial/conventional films. Illustrations of these applications are provided with a Co-Sn-Ce/Si(100) film for power factor determination and with a Ba₂YCu₃O₇/SrTiO₃(100) film for thermal conductivity derivation.

本文言語	English
ページ（範囲）	05EB021-05EB024
ジャーナル	Japanese Journal of Applied Physics
巻	48
号	5 PART 3
DOI	https://doi.org/10.1143/jjAP.48.05EB02
出版ステータス	Published - 2009 5

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

文献へのアクセス

10.1143/jjAP.48.05EB02

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引用スタイル

A high-Throughput screening system for thermoelectric material exploration based on a combinatorial film approach. / Otani, Makoto; Thomas, Evan L.; Wong-Ng, Winnie; Schenck, Peter K.; Chang, Kao Shuo; Lowhorn, Nathan D.; Green, Martin L.; Ohguchi, Hiroyuki.

In: Japanese Journal of Applied Physics, Vol. 48, No. 5 PART 3, 05.2009, p. 05EB021-05EB024.

研究成果: Article

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