A new DC-offset and I/Q-mismatch compensation technique for a CMOS direct-conversion WLAN transmitter

Kiyoshi Yanagisawa, Noriaki Matsuno, Tadashi Maeda, Shinichi Tanaka

研究成果: Conference contribution

5 引用 (Scopus)

抜粋

This paper presents a novel DC-offset and I/Q-mismatch compensation technique with short convergence time, high accuracy, and low-circuit-complexity In this technique, all kinds of transmitter nonidealities, i.e. an offset and a mismatch, can be detected using adequate pair of DC test signals. The test signals are designed so that the envelope of the modulator RF outputs for each test signal fluctuates when the offset or mismatch exists. The fluctuations are converted to a baseband signal using an envelope detector which is designed as a signal dynamic range compressor to avoid saturation in following stages. The polarity of this fluctuation is detected by a comparator instead of a multi-bit analog to digital converter, and a binary-search-type algorithm optimizes parameters for the offset and mismatch compensation using the 1-bit comparator output. This technique was demonstrated in a 0.18-μm CMOS 5-GHz-band WLAN transmitter. The DC offset was suppressed to -43 dBc and the image tone was suppressed to -49 dBc.

元の言語English
ホスト出版物のタイトル2007 IEEE MTT-S International Microwave Symposium Digest
ページ85-88
ページ数4
DOI
出版物ステータスPublished - 2007 10 2
イベント2007 IEEE MTT-S International Microwave Symposium, IMS 2007 - Honolulu, HI, United States
継続期間: 2007 6 32007 6 8

出版物シリーズ

名前IEEE MTT-S International Microwave Symposium Digest
ISSN(印刷物)0149-645X

Conference

Conference2007 IEEE MTT-S International Microwave Symposium, IMS 2007
United States
Honolulu, HI
期間07/6/307/6/8

ASJC Scopus subject areas

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • これを引用

    Yanagisawa, K., Matsuno, N., Maeda, T., & Tanaka, S. (2007). A new DC-offset and I/Q-mismatch compensation technique for a CMOS direct-conversion WLAN transmitter. : 2007 IEEE MTT-S International Microwave Symposium Digest (pp. 85-88). [4263747] (IEEE MTT-S International Microwave Symposium Digest). https://doi.org/10.1109/MWSYM.2007.380260